Device and method for determining microwave reflection point of slow wave system for traveling wave tube with helical line
A slow-wave system and microwave reflection technology, applied in the direction of measurement/testing in the manufacturing process, can solve the problems of secondary damage of the slow-wave system, difficulty in finding out the problem, etc. simple effect
Active Publication Date: 2013-08-07
HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE
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Problems solved by technology
Since the slow-wave system is a precision device, it has been welded and heat-shrinked many times during the production process. If the microwave reflection point of the slow-wave system of the helical traveling wave tube is determined through anatomical tests, it will affect the slow-wave The system produces secondary damage, and it is difficult to find out the problem in this way
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[0023] The specific implementation manner of the present invention will be described in further detail below by describing the best embodiment with reference to the accompanying drawings.
[0024] like figure 1 and figure 2 As shown, the device for determining the microwave reflection point of the helical traveling wave tube slow wave system, the helical traveling wave tube slow wave system includes a vacuum shell, a helix 3 is arranged inside the vacuum shell, and the vacuum shell A concentrated attenuator 4 is provided between the helix 3 and the device is composed of a cylindrical body 1 that penetrates the helix 3; the length of the cylindrical body 1 is greater than that of the slow wave system; the The outer diameter of the cylindrical body 1 is smaller than the inner diameter of the helix 3 , and the outer surface of the end of the cylindrical body 1 penetrating the helix 3 is coated with a carbon layer.
[0025] In order to prevent the oscillation caused by the inte...
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The invention discloses a device and a method for determining a microwave reflection point of a slow wave system for a traveling wave tube with a helical line. The device consists of a cylindrical body penetrating into the helical line; the length of the cylindrical body is bigger than that of the slow wave system; the outside diameter of the cylindrical body is smaller than the inside diameter of the helical line; the external surface of one end of the cylindrical body penetrating into the helical line is coated with a carbon layer; and the method comprises the following steps: moving back and forth in a passage of the helical line by utilizing the device, and analyzing the change of the wave shape of a standing wave of the traveling wave tube with the helical line through a vector network analyzer, thereby determining the reason and the position of the reflection of a microwave signal and providing guidance for the design and the manufacture of the slow wave system of the helical line. The device and the method do not adopt a method for anatomizing an experiment; the damage to the slow wave system of the traveling wave tube cannot be formed; further, the operation is convenient;and the device and the method have a quite good testing effect.
Description
technical field [0001] The invention belongs to the field of microwave vacuum electronic devices, and in particular relates to a device and a method for determining a microwave reflection point of a slow wave system of a helical traveling wave tube. Background technique [0002] As a microwave power amplifier device, traveling wave tube has many advantages such as wide frequency band, high gain, large dynamic range and low noise. Its working principle is: the weak electromagnetic signal on the external transmission line enters the slow wave system through the input coupling system, interacts with the electron beam emitted by the electron gun, and the signal amplified by the electron beam is transmitted from the output coupling system to the external transmission line. Due to the practical application of traveling wave tubes, it is difficult to ensure good impedance matching between the input and output energy coupling system and the slow wave system and between various parts...
Claims
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IPC IPC(8): H01J9/42
Inventor 吴华夏高红梅袁璟春张文丙王瑞李宾宾沈俊程海
Owner HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE