6results about "Manufacture testing/measurements" patented technology

The application relates to a device and a method for precise assembly of an ECR ion source, which comprises a support, a sliding rail device, a measuring head, a motor device and a control system; the top of the support is provided with the sliding rail device, the sliding rail device is provided with the measuring head, the measuring head is provided with two Hall piece grooves for mounting Hall pieces, the Hall pieces are used for measuring the magnetic field intensity at the corresponding positions of a plasma arc cavity of the ECR ion source; the sliding rail device is further provided with a grating ruler, a reference origin switch, a positive limit switch and a negative limit switch; the control system is electrically connected with the motor device, the grating ruler, the reference origin switch, the positive limit switch and the negative limit switch, the motor device is electrically connected with the sliding rail device, the control system is used for controlling the motor device to work, thereby controlling the movement and rotation of the measuring head in a three-dimensional space through the sliding rail device, determining the magnetic field intensity in any direction, and determining the assembly of related components of the ECR ion source based on the magnetic field intensity, and the application can be widely used in the field of precise assembly.

The utility model relates to the technical field of electron tube processing discloses an electron tube sealing and separating tool, including force application equipment and spring draw hook, both ends of spring draw hook are equipped with the hook, and one end of spring draw hook is hung on force application equipment, and the other end is used for connecting the one end of electron tube body far from the exhaust pipe. The electron tube sealing and separating tool of the utility model is applied to the sealing and separating process of the electron tube with large volume and mass, adopts the mode of providing lifting force by force application equipment to replace manual support electron tube, makes the sealed exhaust pipe separate from the vacuum acquisition system, improves operation convenience and safety, and satisfies the sealing and separating requirement of superpower electron tube.

This invention discloses a photomultiplier tube (PMT) dynode film preparation system and method belonging to the field of PMT technology. The system includes a PMT, a vacuum system, and an alkali source assembly. The alkali source assembly includes an external glass tube and internal K, Na, and Cs sources. One end of the glass tube is closed, and the other end is connected to the vacuum system via a tail tube. One end of the PMT is also closed, and the other end is connected to the vacuum system via a tail tube. The K, Na, and Cs sources are connected to pin electrodes via nickel wires to form a circuit. Eleven pin electrodes are led out from the inside of the PMT. This invention can accurately and effectively monitor the secondary electron emission capability of the dynode film, solving the problem of lack of quality control in the dynode preparation process. Furthermore, it improves the secondary electron emission coefficient of the dynode film, resulting in a significant increase in overall PMT gain and achieving good consistency.

The invention relates to the technical field of semiconductor equipment maintenance, in particular to a vacuum baking platform, a control system, a control method and a storage medium, the vacuum baking platform comprises a lens cone, a lamp filament is arranged in the lens cone, a through hole is formed in the lower end of the lens cone, and the position of the lamp filament in the lens cone can be adjusted to directly face the through hole; the vacuum valve is arranged on the lens cone and located at the through hole; the supporting cylinder is arranged at the lower end of the lens cone in a sealing manner; the Faraday cup is arranged at the bottom of the supporting cylinder and directly faces the through hole, and a diaphragm is arranged on the Faraday cup; the first vacuumizing assembly is communicated with the lens cone; the second vacuumizing assembly and the third vacuumizing assembly are both communicated with the supporting cylinder; and the heating assembly is used for heating the vacuum baking platform. Vacuum can be quickly established, and meanwhile the success rate of filament replacement can be increased.

The invention relates to the technical field of traveling wave tube detection, in particular to a high-frequency collector assembly performance detection device and method.The detection device comprises a sealing box, a vacuum baffle valve is arranged in the sealing box, the sealing box is divided into a rear half box and a front half box through the vacuum baffle valve, and the rear half box and the front half box are provided with air exhaust holes connected with a vacuumizing device; the front half box is provided with an interface; the front end of the detection connecting piece is provided with an input end cover connecting piece, the rear end of the detection connecting piece can be welded with the interface, and the detection connecting piece is internally provided with a communicating hole penetrating front and back; the front end of the input end cover connecting piece can be matched and connected with input high frequency; after the input end cover connecting piece is cut from the detection connecting piece, the rear end of the input end cover connecting piece can be matched and connected with the electronic gun; according to the invention, the performance of the high-frequency and collector assemblies can be detected before the traveling wave tube is assembled into a whole tube, only the unqualified high-frequency and collector assemblies need to be scrapped when the high-frequency and collector assemblies are detected to be unqualified, the electronic gun can be reused, and the cost is saved.

The invention discloses a micro-electro-mechanical optical quantum digital low-light device and a packaging method thereof. The micro-electro-mechanical optical quantum digital low-light device comprises a cathode, a tube shell precursor and a tube shell rear body, the MCP is packaged in the tube shell precursor; a CMOS circuit is arranged in the tube shell rear body; an HTCC base is arranged at the plugging end of the tube shell rear body; when the device is used, voltage is respectively applied to the cathode, the MCP input, the MCP output and the electrode of the CMOS circuit, the voltage difference between any two adjacent electrodes is 50-3000V, the device is low in power consumption, high in image frame frequency and low in working illumination, the night vision requirement is met, and meanwhile, the image output meeting the frame frequency requirement can be realized.