272results about "Tube/lamp factory adjustment" patented technology

In a dielectric window 41 for a plasma processing apparatus, a first dielectric window recess 47 is formed on an outer region of a surface of the dielectric window 41 in a diametrical direction of the dielectric window 41 at a side where plasma is generated, and the first dielectric window recess 47 is extended in a ring shape and has a tapered shape inwardly in a thickness direction of the dielectric window 41. A multiple number of second dielectric window recesses 53a to 53g are formed between the center of the dielectric window 41 and the first dielectric window recess 47, and each of the second dielectric window recesses 53a to 53g is recessed inwardly in the thickness direction of the dielectric window 41 from the surface of the dielectric window 41.

This invention provides an electron source manufacturing apparatus which can be easily downsized and operated. The electron source manufacturing apparatus includes a support member for supporting a substrate (10) having a conductor (11), a vessel (12) which has a gas inlet port (15) and a gas exhaust port (16) and covers a partial region of the surface of the substrate (10); a gas inlet unit (24) connected to the gas inlet port (15) to introduce gas into the vessel, an exhaust unit (26) connected to the gas exhaust port to evacuate the interior of the vessel, and a voltage application unit (32) for applying a voltage to the conductor.

A display device capable of early finding a sign such as misregistration or width variation of an emission layer formed by a layer transfer method, and a manufacturing method of the same are provided. In an inspection region 150 outside of an effective region 110, inspection pixels Px2 made up of organic light-emitting elements 10R, 10G and 10B are provided, and a distance W2 between the inspection pixels Px2 on both sides of a color targeted for inspection is shorter than a distance W1 between display pixels Px1 on both sides of the color targeted for inspection. Based on a change in a chromaticity or a spectrum shape of EL or PL light emission of the inspection pixel Px2, a sign such as misregistration of a red-light emission layer 15CR, a green-light emission layer 15CG, is found at an early stage.

A method of making an OLED display device for producing an image includes forming an array of light producing elements; testing the array of light producing elements and recording the location of defective light producing element(s); providing a default pattern of the array of color filter elements having at least two different colors; and forming an array of color filter elements in response to the recorded location of the defective light producing element(s), the location of at least one color filter element being changed from the default pattern.

A surface conduction electron-emitting device has an electroconductive film including an electron-emitting region between a pair of electrode on a substrate. The electroconductive film is formed by producing a precursor film of an organic metal compound or complex thereof and then turning the precursor film into the electroconductive film by keeping the temperature of the film above the decomposition temperature of the organic metal compound or the complex thereof and applying a voltage to the film. A plurality of such electron-emitting devices are arranged on a substrate in a matrix or ladder-like manner to constitute an electron source. Such an electron source is used with an image-forming member disposed vis-a-vis the electron source to form an image-forming member.

A system for generating correction factor data that is representative of the distortion characteristics of a cathode ray tube. The correction factor data is stored with a cathode ray tube to allow later alignment of a video signal, or can be provided on a storage medium or on a network. Distortion data, and resultant correction factor data is generated for a series of discrete physical locations on the cathode ray tube screen. In this manner, the entire screen surface can be utilized to align a video image. Maximum correctable distortion data is also generated in accordance with the present invention to provide exit criteria for cathode ray tube manufacturers. The exit criteria is based upon maximum correction factor data that can be generated to correct distortions. A characterization module is provided that can be coupled to cathode ray tube coils that stores the correction factor data or an identification number for the cathode ray tube that can be used to retrieve the correction factor data from any desired source such as CD ROMS, a LAN, a database coupled to a WAN, or the Internet, etc. Interpolation techniques can be used to generate correction factor data for any desired number of interpolation points based upon correction factor data provided for a lesser number of characterization locations.

It is an object of this invention to provide an electron generating apparatus which is hardly influenced by variations in driving voltage, an image forming apparatus using the electron generating apparatus, and a method of manufacturing and adjusting the same. The row wiring layers of a multi-electron-beam source (300) are sequentially selectively switched by a control circuit (302) and applied with a pulse voltage having a value about 1.05 to 1.5 times the maximum value of a normal driving voltage from a DC voltage source (301). The characteristics of all surface conduction electron-emitting devices of the multi-electron-beam source (300) are shifted to the high potential side. With this process, even when the driving voltage becomes high due to superposition of noise and the driving voltage, variations in electron-emitting characteristics caused by the voltage shift characteristics of the surface conduction electron-emitting devices can be prevented.

The invention relates to a method for forming a telescoped multiwall nanotube. Such a telescoped multiwall nanotube may find use as a linear or rotational bearing in microelectromechanical systems or may find use as a constant force nanospring. In the method of the invention, a multiwall nanotube is affixed to a solid, conducting substrate at one end. The tip of the free end of the multiwall nanotube is then removed, revealing the intact end of the inner wall. A nanomanipulator is then attached to the intact end, and the intact, core segments of the multiwall nanotube are partially extracted, thereby telescoping out a segment of nanotube.

There is provided a characteristic adjustment method for an image forming apparatus that is provided with a multi-electron source in which a plurality of electron-emitting devices are electrically connected by wiring and arranged on a substrate and a fluorescent member for emitting light by irradiation of an electron beam, the method including: a measurement step of dividing a display portion of the image forming apparatus into a plurality of areas and measuring light emitting characteristics of at least one or more of the electron-emitting devices in the respective divided areas, and a shifting step of shifting the light emitting characteristics of the electron-emitting devices in the divided areas to individual characteristic target values by applying a characteristic shift voltage to the electron-emitting devices.

The size of a foreign substance which is present between a cathode and an anode and which contributes to a short circuit therebetween is measured. On the basis of the measured size, the wavelength of a laser beam with which the foreign substance is irradiated is set, as is the number of times of irradiation. The foreign substance is irradiated with the laser beam to eliminate at least part of the foreign substance.

An electron source/image display device manufacturing apparatus according to this invention includes (A) a support which supports a substrate having a first major surface and a second major surface on which a conductor is arranged, and includes a plurality of electrostatic chucks each having a conductive member, (B) a vessel which has a gas inlet port and an exhaust port, and covers part of the first major surface, (C) a valve connected to the inlet port to introduce gas into the vessel, (D) an exhaust system connected to the exhaust port to exhaust the gas from the vessel, and (E) a power supply for applying a predetermined potential difference between the conductor and the conductive member. This apparatus arrangement enables easy, stable processing in the “forming” and “activation” steps.

A field emission source comprising a first conductive region, a layer of nanotubes deposited on the first conductive region, and a second conductive region placed over and spaced from the nanotube coated first conductive region. After the device structure is fabricated, a laser beam is used to dislodge one end of the nanotube from the first conductive surface and an electric field is simultaneously applied to point the freed end of the nanotube at the second conductive region.

A method of measuring luminance of an image display apparatus, a method of manufacturing the same, and a method and an apparatus for adjusting characteristics of the same, in which accuracy of measurement is improved while reducing time for measuring luminance of a pixel are provided. A plurality of devices that are not adjacent to each other (for example the devices of the same color out of R, G, and B) are selected and illuminated simultaneously, and luminance is measured for each of them. Based on measured luminance, the electron-emitting characteristics of the respective electron-emitting device as are adjusted based on measured luminance.

A method of producing an electron emission device having a low threshold electric field needed to emit electrons without unintentional electron emission includes a first step of preparing a first conductive film, second conductive film, and a material which constitutes an electron emission part connected to the first conductive film, and a second step of setting a threshold electric field strength, which is needed to start electron emission in a situation where a higher electric potential is applied to the first conductive film than that applied to the second conductive film, to a value greater than a threshold electric field strength, which is needed to start electron emission in a situation where a higher electric potential is applied to the second conductive film than that applied to the first conductive film.

A spark plug is provided, for a provisional bending process for manufacturing the spark plug, as a work in a condition where an earth electrode is straight and substantially in parallel with an axial line of a center electrode. In the provisional bending process, two searchers individually facing the tip of the center electrode with the tip located therebetween are arranged, positions of the searchers in a first direction perpendicular to the axial line being adjusted for every spark plug. Then a bending punch is driven to press a second end-surface of the other end of the earth electrode down to the searchers so that the earth electrode is provisionally bent at a substantially perpendicular angle to the axial line, the second end-surface being opposite to the first end-surface. Preferably, before the provisional bending process, positioning the work and correcting the position and tilt of the work are performed.

In a producing method for an electron beam emitting device, a position of a stray emission source constituting an unnecessary electron emitting part on a cathode substrate is detected, and an energy is locally applied to the detected position thereby eliminating the stray emission source, thereby providing an excellent electron beam apparatus without a deterioration in a constituent member or a trouble by an accidental discharge.

The rare gas discharge lamp is supplied with a current, which is lower than the rated current, the voltage of the rare gas discharge lamp is determined at this instant and the swing width of this voltage is measured. A comparator for comparing measured values of the swing width of the voltage of the rare gas discharge lamp when the current control supplies a reduced current, which is lower than the rated current. A service life converter for converting the difference value output by the comparison means into an indication of the service life of the rare gas discharge lamp.

An object of the present invention is to efficiently adjust a positional difference (measured along the direction perpendicular to the center electrode axis) between the center electrode (CE) axis and the center of the earth electrode (EE). The CE tip and EE end tip surface are illuminated from the front of the EE tip tip surface, thereby picking up their images. The image processing unit calculates the positional difference between the CE axis and EE center. Here, the EE center is defined by an area centroid of the EE tip surface area, thereby improving a measurement accuracy. The adjustment unit connected with the image processing unit causes the actual positional difference to decrease by moving EE by the that calculated positional difference, taking a prescribed spring-back into consideration. EE is moved by a jig moved by a screw rotated by a motor.

A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device, wherein the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device, and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.