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Low temperature environment testing apparatus

A test device and low-temperature environment technology, which is applied in the field of low-temperature performance test devices for electronic products, can solve the problems of poor low-temperature constant state, slow cooling speed, complex structure, etc., and achieve the effects of ensuring stability, improving stability, and being easy to use and operate

Inactive Publication Date: 2012-06-06
XIAN DAYU PHOTOELECTRIC TECH
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AI Technical Summary

Problems solved by technology

At present, the low-temperature environmental test devices of many domestic enterprises have complex structures, slow cooling speed, poor low-temperature constant state, and high energy consumption.

Method used

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Embodiment Construction

[0026] Such as figure 1 , figure 2 and image 3 As shown, the present invention includes a low-temperature working chamber 9, a controller 12, a cold air intake window 7 installed on the left or right side wall of the low-temperature working chamber 9, and installed on the right or left side wall of the low-temperature working chamber 9. The upper airflow return window 8, a cold air circulation channel arranged on the outside of the low-temperature working chamber 9 and continuously inputting cold air into the low-temperature working chamber 9, and a temperature detection device that detects the internal temperature of the low-temperature working chamber 9 in real time. The cold air circulation channel includes a cold air inlet channel 6 and an air return air channel 10. The upper ends of the cold air inlet channel 6 and the air return air channel 10 are connected, and the connection between the two is arranged to be connected to the compressor unit 1. The lower ends of the co...

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Abstract

The invention discloses a low temperature environment testing apparatus. The apparatus comprises a low temperature working bin, a controller, a cold air intake window, an airflow returning window, a cold air circulation channel and temperature-detecting devices; the cold air circulation channel comprises a cold airflow intake channel and an airflow returning channel, a low temperature exchanger is arranged at a position where the cold airflow intake channel and the airflow returning channel joint, a fan set is installed on the cold airflow intake channel or on the airflow returning channel, and the fan set continuously sends cold airflow obtained after the low temperature exchanger carries out low temperature exchange to the low temperature working bin through the cold airflow intake channel and synchronously continuously pumps air in the low temperature working bin to the position where the low temperature exchanger is installed through the airflow returning channel for low temperature exchange, thereby realizing continuous circular flowing of air in the cold air circulation channel. The low temperature environment testing apparatus provided in the invention has the advantages of a simple structure, compact installation, convenient arrangement, simple usage and operation, a good application effect, a fast cooling speed, a good constant temperature effect and low energy consumption and can effectively overcome a plurality of practical problems of conventional low temperature environment testing apparatuses.

Description

Technical field [0001] The invention relates to a low-temperature performance test device for electronic products, in particular to a low-temperature environment test device. Background technique [0002] The rapid cooling environment test of electronic products is a necessary means to eliminate early failure of electronic products and control product quality. The cooling rate of the test environment and the constant state of the low temperature temperature are important technical indicators of the test conditions, and they will directly affect the test results of the electronic products. At present, many domestic enterprise electronic products low-temperature environmental test devices have complex structures, slow cooling speed, poor low-temperature temperature and high energy consumption. Summary of the invention [0003] The technical problem to be solved by the present invention is to provide a low temperature environment test device in view of the above-mentioned deficienci...

Claims

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Application Information

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IPC IPC(8): G01N17/00
Inventor 李美川张超
Owner XIAN DAYU PHOTOELECTRIC TECH
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