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Ultraviolet sensing reinforced film quantum efficiency testing method

A test method and enhancement film technology, applied in the direction of testing optical performance, etc., can solve the problems of inaccessibility of the CCD sensor, inaccurate calculation, etc., and achieve the effect of overcoming the low measurement accuracy, improving the accuracy and reducing the error.

Inactive Publication Date: 2012-06-20
UNIV OF SHANGHAI FOR SCI & TECH
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

At the same time, the CCD sensor cannot be allowed to enter the saturation state, because the charge packet generated by entering the saturation state will lose the charge, because it is difficult, so that the calculation is inaccurate

Method used

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  • Ultraviolet sensing reinforced film quantum efficiency testing method
  • Ultraviolet sensing reinforced film quantum efficiency testing method
  • Ultraviolet sensing reinforced film quantum efficiency testing method

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Experimental program
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Embodiment Construction

[0019] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0020] Taking 360nm monochromatic light incident on the UV frequency conversion film as an example, calculate its frequency conversion efficiency

[0021] 1) The frequency conversion efficiency is defined as: the ratio of the number of ultraviolet photons that undergo wavelength conversion on the surface of the film to the number of ultraviolet photons incident on the film is specifically expressed as formula (1)

[0022] CE = Photons emitted Photons incident - - - ( 1 )

[0023] 2) Calculate the number of photons of incident UV correction photons on the surface of the film incident

[0024] By formula (2) Calculation of incident UV corrected photon ...

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Abstract

An ultraviolet sensing reinforced film quantum efficiency testing method includes: A), defining the quantum efficiency as the ratio of the number of ultraviolet photons subjected to wavelength conversion on the surface of a film to the number of ultraviolet photons emitted into the film; B), computing the number of incident ultraviolet correction photons on the surface of the film; C), computing the correction number of the solid angle according to the formula SA=2pir(1-cos); D), computing the number of the ultraviolet photons subjected to wavelength conversion on the surface of a sample; and E), substituting the photonsemitted and photonsincident into the formula (1) to solve the quantum efficiency CE. By measuring power directly, the testing method is free of the link of photoelectric conversion and effectively overcomes the defect that measurement precision of the ultraviolet sensing reinforced film quantum efficiency testing method in the prior art is low. Accuracy, operability, stability and the like are all taken into consideration of comprehensive technology in the technical scheme, the testing method is convenient in operation and high in stability while reducing error greatly and increasing measurement accuracy effectively.

Description

technical field [0001] The invention relates to a method for testing the frequency conversion efficiency of an ultraviolet sensing enhanced film. Background technique [0002] Frequency conversion efficiency is an important parameter to measure many devices. Frequency conversion efficiency or QE (Quantum Efficiency), the traditional test method for frequency conversion efficiency, is calculated by the number of electrons that can be generated and collected for each incident photon. Taking into account the photons that cannot be transmitted to the silicon wafer after reflection loss, photoelectric conversion, changes in the transmission efficiency of electrons and photons, and the efficiency of conversion current. For example, the charge signal in the 512×512 area array CCD provided by the 44 Research Institute of Electronic Technology Group is output by AOpin. The electrons collected by the CCD are injected into the charge amplifier, and the current generated by the photons...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 陶春先姜霖张大伟黄元申倪争技庄松林
Owner UNIV OF SHANGHAI FOR SCI & TECH