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Integrated test stand for transformers

A technology for test benches and transformers, used in instruments, measuring electrical variables, pulse technology, etc., can solve the problems of difficulty in placing test instruments neatly, cluttered instrument wiring, and large data errors, achieving light weight, short test time, and convenience. The effect of mobile use

Active Publication Date: 2014-01-22
STATE GRID CORP OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the test, two testers are often reserved on the upper part of the main transformer to change the wiring, and the test of a single main transformer requires many people and takes a long time
At the same time, the instrument operator needs to frequently switch the instrument wiring, which can easily lead to wiring errors, ranging from large data errors to equipment damage and electric shock
[0003] In addition, it is difficult to arrange the test instruments neatly on site, and the field instrument wiring is messy

Method used

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  • Integrated test stand for transformers
  • Integrated test stand for transformers
  • Integrated test stand for transformers

Examples

Experimental program
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Embodiment Construction

[0026] Depend on Figure 1-8 As can be seen from the shown embodiment, it includes a test bench body, a CPU, a keyboard, a liquid crystal display, a switch control circuit and a test wiring switching circuit; the keyboard is connected to the corresponding input terminal of the CPU, and one output terminal of the CPU is connected to a switch The input end of the control circuit, the other output end of which is connected to the liquid crystal display screen, the output end of the switch control circuit is connected to the control end of the test wiring switching circuit; terminals (see figure 1 ).

[0027] This embodiment also includes the bushing end screen grounding terminal (see Figure 5 ).

[0028] This embodiment also includes a wireless communication module, a remote controller, an LED display and an LED warning lamp screen (see figure 1 ).

[0029] The switch control circuit described in this embodiment (see figure 2 ) consists of resistors R1~R27, photocouplers ...

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PUM

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Abstract

The invention relates to an integrated test stand for transformers, which comprises a test stand body, a CPU (central processing unit), a keyboard, a liquid crystal display, a switch control circuit, a test wiring switching circuit, a bushing end shield grounding terminal, a wireless communication module, a remote controller, an LED display and an LED alarm lamp screen. The integrated test stand has the advantages that (1), a wire outlet terminal of a winding of a transformer can be automatically switched onto corresponding testing equipment according to testing items, equipment side wiring and instrument side wiring do not need to be changed, required testing staffs are few, testing time is short, and operation is safe; and (2), the testing items for insulating resistance of the winding, dielectric loss of the winding, direct-current resistance of the winding, low-voltage short-circuit impedance, on-load switch recording, transformation ratio of the winding, bushing testing and the like of the transformer can be completed by one-step wiring.

Description

technical field [0001] The invention relates to a transformer integrated test bench, which can complete winding insulation resistance, winding dielectric loss, winding DC resistance, low-voltage short-circuit impedance, on-load switch wave recording, winding transformation ratio and bushing of the transformer with one-time connection. Test items, etc. Background technique [0002] At present, in the transformer test, when changing the test items, it is often necessary to change the test wiring. During the test, two testers are often reserved on the upper part of the main transformer to change the wiring, and the test of a single main transformer requires many people and takes a long time. At the same time, instrument operators need to frequently switch instrument wiring, which can easily lead to wiring errors, ranging from large data errors to equipment damage and electric shocks. [0003] In addition, it is difficult to place test instruments neatly on site, and the wirin...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R1/20G01R1/04H03K17/78
Inventor 张贺伟黄普利张丽芳吴灏韩海军赵峻峰冯超王泽霖苏轶超王玮民孙红燕齐辉霍维光李亮李耀强曹彦红白玉林凌云志
Owner STATE GRID CORP OF CHINA
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