Method for testing dual inline memory modules (DIMM)
A chip and logic technology, applied in the test field of test efficiency, can solve the problems of slow test speed of special test software, limited number of DIMM slots, high price of server motherboards, etc., achieve good promotion and use value, improve test efficiency and test speed fast effect
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[0017] A method for implementing a DIMM test provided by the present invention will be described in detail below with reference to the accompanying drawings.
[0018] In order to improve the efficiency of DIMM test, realize the read and write. as attached figure 1 As shown, a method for implementing DIMM testing is now provided, and the specific implementation steps are:
[0019] Firstly, the field programmable gate array FPGA chip is connected to the control chip, the high-speed interface and the DIMM logic interface of the dual in-line memory module with multiple channels. The DIMM verification system is composed of the FPGA chip, the control chip, the high-speed interface and the DIMM logic interface. The verification system forms an electronic disk; then the read and write instructions of the master device are sent to the system through the high-speed interface; finally, the control chip is responsible for instruction parsing and by controlling the DIMM logic to perform r...
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