Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System for detecting matching error of TDICCD (Time Delay and Integration Charge Coupled Device) focal plane different-speed imaging

A matching error and detection system technology, applied to measuring devices, instruments, etc., can solve problems such as deterioration, image quality degradation, and camera image movement

Inactive Publication Date: 2012-07-04
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF5 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] During the push-broom imaging process of the large-size focal plane TDICCD camera, factors such as the pointing accuracy of the satellite platform's flight attitude, stability changes, drift angle changes, orbital velocity-to-height ratio changes, high-frequency vibration (or jitter), and large-size TDICCD The difference in the performance of each imaging unit on the focal plane will cause the camera to generate image motion during the integral imaging process, which will degrade or even deteriorate the image quality

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System for detecting matching error of TDICCD (Time Delay and Integration Charge Coupled Device) focal plane different-speed imaging
  • System for detecting matching error of TDICCD (Time Delay and Integration Charge Coupled Device) focal plane different-speed imaging
  • System for detecting matching error of TDICCD (Time Delay and Integration Charge Coupled Device) focal plane different-speed imaging

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] Such as figure 1 As shown, the large-size TDICCD focal plane allometric imaging matching error detection system of the present invention includes a dynamic target simulation device 1 , a collimator 2 , a variable magnification and focusing imaging system 3 , a control system 5 , and an image snapshot system 6 .

[0015] Such as figure 2 As shown, the dynamic target simulation device 1 is composed of a point light source 1-7, a heat shield 1-13, a reflector 1-12, a condenser lens 1-8, an optical filter 1-9, a second reflector 1-10, The third reflector 1-11, the dynamic target drum 1-1, the first reflector 1-3, the deflection mirror 1-2, the precision turntable 1-4, the deflection angle rotation table 1-5 and the workbench 1-6 Composition; the drift angle rotating workbench 1-5 is placed on the workbench 1-6, and its rotating shaft is dynamically matched with the round hole on the workbench 1-6; the precision turntable 1-4 is fixed on the drift angle turntable 1-5 abov...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a system for detecting matching error of TDICCD (Time Delay and Integration Charge Coupled Device) focal plane different-speed imaging. A dynamic target simulation device of the system is arranged in front of a parallel collimator; a zoom focusing and imaging system is arranged between the parallel collimator and a TDICCD focal plane and is composed of a group of zooming and imaging units; a control system adjusts focal distance and axial position of each zooming and imaging unit of the zoom focusing and imaging system, thus each imaging unit on the TDICCD focal plane produces target images at different speeds, moving speeds of the target images on each imaging unit on the TDICCD focal plane are calculated according to the focal distance of each zooming and imaging unit, a target rotating speed and the focal distance of the parallel collimator; and an image quick-look system analyzes dynamic target images, and a dynamic transfer function and a dynamic resolution of each imaging unit of the TDICCD focal plane are obtained by calculation. The system provided by the invention can be applied to detection on large-scale TDICCD focal plane imaging quality, image motion compensation accuracy and array different-speed image motion compensation matching accuracy.

Description

technical field [0001] The invention belongs to the field of TDICCD imaging detection, and relates to a large-scale TDICCD focal plane allometric imaging matching error detection system. Background technique [0002] With the development of remote sensing technology, the resolution requirements for satellite optical imaging are getting higher and higher, and the coverage width requirements are getting larger and larger. In order to meet the demand, on the one hand, by increasing the focal length and effective aperture of the camera optical system, the ground resolution of the optical remote sensor can be effectively improved; The optical system of the field can effectively increase the ground coverage width of the optical remote sensor. At present, for optical remote sensors with high resolution and wide coverage width, TDICCD cameras with large focal planes for push-broom imaging are mostly used. [0003] During the push-broom imaging process of the large-size focal plane...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
Inventor 张晓辉马洪涛韩冰
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products