Measuring probe structure for charging charge inside medium
A charge and medium technology, applied in the field of on-orbit monitoring structures, can solve problems such as limiting the effectiveness of parameter acquisition and difficult to reproduce the space environment
Active Publication Date: 2014-05-07
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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Problems solved by technology
[0003] Since it is difficult to reproduce the real space environment in the ground simulation test, and the limitation of the test technology also greatly limits the effectiveness of parameter acquisition, it is the current field to actively carry out the flight test and numerical simulation technology of the electrified effect in the spacecraft. mainstream trends
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[0013] The probe structure of the medium internal charge measuring device of the present invention will be further described below in conjunction with the accompanying drawings.
[0014] Such as figure 1 As shown, the probe structure of the medium internal charge measuring device of the present invention includes: using the printed circuit board process to set the grids 4, 5, 6, 7, 8, 9 in the 6-layer printed circuit board on the three-layer FR4 substrate, three Layer circuit board material FR4 substrate is the first layer substrate, the second layer substrate and the third layer substrate. The outer peripheral parts of the three substrates are provided with the first via hole and the second via hole in sequence. The height and diameter of the first via hole are larger than The height and diameter of the second via hole, the second layer substrate in the middle of the second via hole is provided with a third via hole and a fourth via hole that respectively penetrate the first ...
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The invention discloses a probe structure for charging charge inside a medium. In the probe structure, six layers of printed circuit board middle aperture plates are arranged on three layers of FR 4 substrates by using a printed circuit board process; a first through hole, a second through hole, a third through hole and a fourth through hole are formed in sequence on the peripheral parts of the three substrates; and the upper and lower end faces of the four through holes are provided with six aperture plates to form three faraday cages respectively, so that the charge inside the medium is measured. The probe structure of a charge measuring device inside the medium can be used for researching on-orbit monitoring load of an electrification effect in a spacecraft, so that a good technical means is provided for an on-orbit monitoring technology of the electrification effect in the spacecraft.
Description
technical field [0001] The invention belongs to the field of measuring the space environment and effects of spacecraft, and in particular relates to an on-orbit monitoring structure for charging effects in spacecraft. Background technique [0002] The charging and discharging effect of spacecraft has become one of the main reasons for spacecraft failure or even damage in orbit. According to the place where it occurs, the electrification effect of spacecraft can be divided into surface electrification and internal electrification. The internal charging of a spacecraft refers to the process in which high-energy charged particles in space pass through the surface of the spacecraft, transport and deposit inside the dielectric material of the spacecraft components to establish an electric field, and are another type of space high-energy particle radiation that is different from the surface charging effect. Spacecraft charging effect. Discharge occurs when the electric field gen...
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IPC IPC(8): G01R29/24
Inventor 张超刘业楠易忠唐小金王志浩邓佳欣陈金刚徐焱林
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG