System and method for testing clock capability of SDH (synchronous digital hierarchy) device

Abstract

The embodiment of the invention discloses a system and a method for testing the clock capability of an SDH (synchronous digital hierarchy) device, wherein the method comprises the following steps: configuring parameters of a clock source, which are required for a test task, according to the test task; controlling a clock switch which is connected between the clock source and a tested device and is in one-to-one correspondence with the clock source according to the test task, so as to realize the connection and disconnection between the clock source and the tested device; setting the tested device according to the test task, and enabling the tested device to implement the test task and further generate a clock output signal; and acquiring test data of the clock output signal, which is generated by the tested device through the implementation of the test task, by a signal measuring device connected with the tested device. According to the system and method disclosed by the invention, the test data can be obtained efficiently and accurately without specific manual test operation.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a clock capability testing system and method for Synchronous Digital Hierarchy (SDH) equipment. Background technique [0002] In the traditional testing of the communication industry, most of them use manual testing. In manual testing, the specific test results are greatly affected by the individual testers. The test results depend on the understanding and understanding of the testers. For multi-type and combination tests , Test items with a large boundary range, without scientific, comprehensive and reasonable test methods, it is easy for testers to fall into the situation of infinite testing, and it is also prone to missing test points, repeated testing of the same test point, and more importantly, missing Abnormal test points lead to incomplete testing. [0003] Especially in the clock capability test of SDH equipment commonly used in the modern communication field, such as c...

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Problems solved by technology

[0002] In the traditional testing of the communication industry, most of them use manual testing. In manual testing, the specific test results are greatly affected by the individual testers. The test results depend on the understanding and understanding of the testers. For multi-type and combination tests , Test items with a large boundary range, without scientific, comprehensive and reasonable test methods, it is easy for testers to fall into the situation of infinite testing, and it is also prone to missing test points, repeated testing of the same test point, and more importantly, missing Abnormal test points, resulting in incomplete testing

[0003] Especially in the clock capability test of SDH equipment commonly used in the modern communication field, such as clock selection function and clock hold capability test, the whole test process often uses test instruments and test tools for auxiliary tests, and there is a probability of manual operation errors, especially There are many test points for clock selection, and manual testing takes a long time; while the clock retention capability test requires multiple rounds, frequent cycle, and long-term monitoring tests of the same type of test parameters, it is difficult to use manual testing methods to be efficient and accurate get test results

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