Disclosed is a
system for comprehensively measuring multiple parameters of a
fiber optic interferometer. The
system comprises a
semiconductor laser unit with tunable narrow linewidth, an opto-
isolator, the interferometer, a carrier wave circuit, a photoelectric
detector, a
data acquisition card and a data-
processing machine, wherein the
semiconductor laser unit is used for providing transmission
signal light, the input end of the opto-
isolator is connected with the output end of the
semiconductor laser unit with the tunable narrow linewidth, a port 1 of the interferometer is connected with the output end of the opto-
isolator, the interferometer is used for reducing the influence of
rayleigh scattering light on the laser unit so as to protect the laser unit to work stably for a long time, the output end of the carrier wave circuit is connected with a port 3 of the interferometer, the carrier wave circuit is used for providing the interferometer with PZT modulating signals, the input end of the photoelectric
detector is connected with a port 2 of the interferometer, the input end of the
data acquisition card is connected with the output end of the photoelectric
detector, the
data acquisition card is used for converting received optical signals into electric signals, the input end of the data-
processing machine is connected with the output end of the data acquisition card, and the data-
processing machine is used for processing digital signals collected by the data acquisition card and giving out parameter values through nonlinearity minimum
least squares and fitting by using
visibility, modulation amplitude and
initial phase difference as undetermined parameters.