Multi-frequency heterodyne phase unwrapping error compensation method

A phase unwrapping and error compensation technology, applied in measurement devices, instruments, and optical devices, etc., can solve the problems of absolute phase map jumping, the large influence of shooting environment and light intensity, etc., and achieve the elimination of jumping points and phase unwrapping. The effect of continuous graph and high stability

Active Publication Date: 2019-02-22
TAIYUAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
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Problems solved by technology

[0005] The present invention mainly solves the problem of how to eliminate the jump of individual pixels generated by phase unwrapping. The classical phase profilometry has very strict requirements on the grating image, which is greatly affected by the shooting environment and light intensity, and the absolute value after phase unwrapping often occurs. The phenomenon of jumping in the phase diagram

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[0032] In order to make the objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0033] In order to better understand the error compensation method of the multi-frequency heterodyne phase unwrapping of the present invention, the classic phase measurement profilometry (PMP) will be described below first.

[0034] When using phase measurement profilometry (PMP) to calculate the absolute phase of the measured object, we use the grating fringe pattern with four phase shifts at three frequencies to calculate the main phase of the grating fringe pattern or the deformed grating fringe pattern. Value and absolute phase after phase unwrapping. In the experiment we used The grating stripes of three frequencies and 0, π, Phase dephasing is carried out by four phase shifts, and the whole process of dephasing (phase unwrapping)...

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Abstract

The invention relates to a multi-frequency heterodyne phase unwrapping error compensation method, belongs to the field of 3D measurement of structured light, and mainly aims at solving the problem ofjump of pixel points generated by phase unwrapping. Direct roundup of m12 is replaced by m12'(1) and m12'(y+1), and compared with direct roundup of m12, jump points are eliminated completely, a step graph is completely continuous, a phase unwrapping graph of the whole grating stripes is continuous, smooth and jump-free, and a stripe image projection process is not influenced by the environment andis more stable.

Description

technical field [0001] The invention belongs to the field of structured light three-dimensional measurement, in particular to an error compensation method for multi-frequency heterodyne phase unwrapping, which is one of the key technologies for structured light three-dimensional measurement. Background technique [0002] Using structured light to obtain 3D information of objects is a very important research field with very important research and application background. In recent years, with the development of optics, computer and image processing technology, optical three-dimensional measurement technology has also been greatly developed and applied, which can be used for reverse design and manufacturing in the early stage and precision testing in the later stage. Among the existing three-dimensional measurement technologies, surface structured light three-dimensional measurement technology occupies a very important position in the field of measurement due to its advantages ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G01B11/25
CPCG01B11/24G01B11/2433G01B11/25G01B11/254
Inventor 王海东肖媛赵贤凌武迎春王安红郭一娜
Owner TAIYUAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
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