Device for measuring normal spectral emissivity of non-transparent material

Abstract

The invention relates to a device for measuring normal spectral emissivity of a non-transparent material. The key points of the technical scheme are as follows: a cylindrical cavity is internally provided with a graphite heating body; the graphite heating body is communicated with a water cooled electrode that is communicated with a direct current power supply; the top of the cylindrical cavity is provided with a hemispherical water cooled flange; observation holes are uniformly distributed on the hemispherical water cooled flange corresponding to a groove on the top of the graphite heating body; a detector, a chopper, and a reflector are respectively arranged outside the observation holes at two sides; the detector and the chopper are respectively connected with a microprocessor control system through lead wires; the microprocessor control system is connected with an artificial intelligent regulator through a lead wire; the artificial intelligent regulator is connected with the direct current power supply through a lead wire; a spherical reflector is arranged outside the middle observation hole on the hemispherical water cooled flange; a Fourier infrared spectrometer and a computer are installed together with the spherical reflector; and the hemispherical water cooled flange is provided with an evacuating device. The device disclosed by the invention has high heating speed, high vacuum degree, and high measurement precision.

Description

Technical field: [0001] The invention relates to a device for accurately measuring spectral emissivity, in particular to a measuring device suitable for measuring normal spectral emissivity of non-transparent smooth materials. Background technique: [0002] Spectral emissivity is an important parameter to characterize the thermal properties of materials. Accurate spectral emissivity data has important scientific significance and application value in the fields of radiation measurement, heat conduction, heating efficiency, infrared remote sensing, and optical constant evaluation. In recent years, despite the rapid development of spectral emissivity measurement technology, its measurement accuracy, especially the measurement accuracy in the high temperature section, still cannot meet the needs of scientific research and application. Therefore, there is an urgent need to develop a high-temperature, wide-wavelength, high-precision material spectrum Emissivity measuring device. [...

AI Technical Summary

Problems solved by technology

However, the theory of multispectral radiation temperature measurement is based on an accurate emissivity model, and the emissivity model is closely related to many factors such as the surface roughness, wavelength, temperature, etc., so it is difficult to find a universal spectral emissivity model

At this stage, the accuracy of multispectral radiation temperature measurement can not meet the needs of spectral emissivity measurement

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