System and method for carrying out EPON (Ethemet-based passive optical network) performance test based on emulational ONU (optical network unit)

Abstract

The invention discloses a system and a method for carrying out an EPON (Ethemet-based passive optical network) performance test based on an emulational ONU (optical network unit). The system comprises an Ethemet management system (EMS), an optical line terminal (OLT), an optical splitter, a plurality of real ONUs, a test instrument and an emulational ONU, wherein the OLT is connected with the EMS by adopting an internally-built or externally-built interface, and the OLT is sequentially connected with the optical splitter, the plurality of real ONUs and the test instrument end to end so as to form a ring-shaped test network. The method comprises the following steps: carrying out initialization on the system for carrying out the EPON performance test based on the emulational ONU; carrying out an emulation test by applying the system; and carrying out analysis on test results so as to obtain a test result. In case of carrying out the test on an EPON system by adopting the system and the method disclosed by the invention, the test complexity can be greatly reduced, and the test cycle can be reduced.

Description

technical field [0001] The invention relates to an Ethernet passive optical network (EPON, Ethernet over PON) performance testing technology, in particular to a system and a testing method for performing EPON performance testing based on a simulated optical network unit (ONU, Optical Network Unit). Background technique [0002] The passive optical network (EPON, Ethernet over PON) of Ethernet is composed of the optical line terminal (OLT, Optical Line Terminal) at the central office, the optical network unit (ONU, Optical Network Unit) at the user end and the optical distribution network (ODN, Optical Distribution Network) composed of a single-fiber bidirectional system for carrying Ethernet / IP services, voice services, TDM services, and CATV services. [0003] figure 1 It is a schematic diagram of the network structure of the existing EPON system, such as figure 1 As shown, ODN is composed of optical fiber and one or more passive optical devices such as passive optical ...

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Problems solved by technology

[0020] 2) The performance of the system cannot be tested by sending and receiving OAM frames, because the chip manufacturer has implemented OAM inside the chip, and has its own extension, and the test tool cannot simulate the private OAM of the chip manufacturer;

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