The invention discloses a
test point insertion method and device based on circuit cost, equipment and a storage medium, and relates to the technical field of EDA. Determining the
insertion point type of the current round and the updated candidate
test point set of the last round, and selecting candidate test points from the candidate
test point set to insert the candidate test points into the circuit for cost
simulation; respectively calculating cost difference values of circuit cost
simulation before and after the candidate test points are inserted, and selecting target test points and corresponding target
insertion sites of which the cost difference values meet a difference value threshold value; and inserting the target test point into the
netlist data, and updating the candidate test
point set according to the number of the remaining insertion points. According to the scheme, for different types of control points and observation points, corresponding cost functions are constructed according to respective circuit characteristics, the circuit characteristics are perfectly matched, the circuit
fault coverage rate and the
observable fault number are greatly improved, and the
algorithm implementation speed is optimized. In the later DFT test stage, the
test complexity and the number of test vectors are remarkably reduced, the scanning
test efficiency is improved, and the influence of untestable faults is reduced.