Test card for testing card readers with various memory card formats
A test card and card reader technology, applied in the field of test cards, can solve problems such as dragging down the overall production capacity of the production line, reducing test accuracy, and high man-hours, so as to avoid abnormal human operations, save labor costs, and increase production capacity.
Inactive Publication Date: 2016-04-27
WISTRON KUSN +1
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Problems solved by technology
As a result, the traditional test procedures for card readers are quite cumbersome and complicated, and it is easy to reduce the accuracy of the test due to human error, and it takes a lot of man-hours, which drags down the overall production capacity of the production line
Method used
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[0039] see Figure 1 to Figure 3 , figure 1 It is an exploded schematic diagram of components of a test card 10 according to the first embodiment of the present invention, figure 2 It is a schematic diagram of the appearance of the test card 10 and a card reader 11 according to the first embodiment of the present invention, image 3 It is a side view of the test card 10 according to the first embodiment of the present invention. The test card 10 is used to test the card reader 11 with various memory card specifications, so as to verify whether the functions of the card slots of the card reader 11 corresponding to different memory card specifications are normal. The user can use the card reader 11 to read multiple memory cards with different specifications. Generally speaking, the memory card specifications compatible with the slots of common card readers can include secure digital memory cards, digital image cards or storage cards. card specifications, etc. Therefore, the...
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The invention provides a test card used for testing a card reader having a plurality of memory card specifications. The test card comprises a first substrate, a second substrate, a first connection terminal group and a second connection terminal group, wherein the second substrate is partially embedded in a surface of the first substrate, the length of the second substrate is substantially smaller than the length of the first substrate, the first connection terminal group is arranged at one end of the surface of the first substrate, is not shielded by the second substrate and is used for contacting with a first transmission terminal group of the card reader to realize electricity conduction, and the second connection terminal group is arranged at one end of the second substrate and is used for contacting with a second transmission terminal group of the card reader to realize the electricity conduction when the first connection terminal group contacts with the first transmission terminal group. According to the invention, test time is greatly reduced; and productivity is improved effectively by avoiding human abnormal operation and saving manpower cost.
Description
technical field [0001] The invention relates to a test card for testing a card reader, in particular to a test card for testing a card reader with various memory card specifications. Background technique [0002] Generally speaking, a portable electronic device, such as a notebook computer, is usually equipped with a card reader capable of reading memory cards of various specifications, so as to facilitate users to read or store data in the memory cards. The type of memory card can be divided into secure digital memory card (SecureDigitalMemoryCard, SD card), digital image card (ExtremeDigital-PictureCard, XD card) or memory stick card (MemoryStickCard, MS card) and so on. When conducting product quality management and verification tests at the factory, testers need to insert memory cards of different specifications into the corresponding slots of the card reader to conduct pass rate tests for the slots of this specification. For example, when it is desired to test the pass...
Claims
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IPC IPC(8): G01R31/01
Inventor 王震柳根金廖兵高凯郭建黄磊黄印
Owner WISTRON KUSN