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Integrating contact resistance measuring system and method

A contact resistance and measurement system technology, applied in the measurement of electrical variables, measurement devices, measurement of resistance/reactance/impedance, etc., can solve the problems of low accuracy and poor data stability, and achieve high accuracy and strong data stability. Effect

Inactive Publication Date: 2012-10-03
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention aims to solve the problem of poor data stability and low accuracy of the contact resistance measurement method, thereby providing an integral contact resistance measurement system and measurement method

Method used

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  • Integrating contact resistance measuring system and method
  • Integrating contact resistance measuring system and method
  • Integrating contact resistance measuring system and method

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Experimental program
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specific Embodiment approach 1

[0030] Specific implementation mode 1. Combination figure 1 Describe this specific embodiment, the integral contact resistance measurement system, which includes a controllable constant current source 1, a standard current-sensing resistor 3, a high-resistance low-magnification voltage amplifier 4, an analog integrator 5, a range switch 6, and a voltage follower 7 , multi-channel AD converter 8 and single-chip microcomputer 9;

[0031] The power output terminal of the controllable current source 1 is connected to one end of the component under test 2; the other end of the component under test 2 is connected to one end of the standard current-sensing resistor 3; the other end of the standard current-sensing resistor 3 is connected to the power ground ;

[0032] The high-impedance low-magnification voltage amplifier 4 collects the voltage at both ends of the component under test 2; the voltage signal output terminal of the high-impedance low-magnification voltage amplifier 4 is...

specific Embodiment approach 2

[0040] Embodiment 2. The difference between this embodiment and the integrated contact resistance measurement system described in Embodiment 1 is that it also includes a liquid crystal display module 10, and the display signal input terminal of the liquid crystal display module 10 is connected to the single chip microcomputer 9. Shows signal output connections.

specific Embodiment approach 3

[0041] Specific embodiment three, the difference between this specific embodiment and the integral contact resistance measurement system described in specific embodiment one is that it also includes a keyboard 11, the keyboard signal output end of the keyboard 11 and the keyboard signal input end of the single-chip microcomputer 11 connect.

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Abstract

The invention discloses an integrating contact resistance measuring system and method, which relate to a resistance measuring system and method and are used for solving the problems of poor data stability and low accuracy existing in a contact resistance measuring method. The method comprises the following steps of: acquiring voltages across a component to be measured by adopting a high-resistance low-power voltage amplifier, and amplifying the acquired voltages; acquiring a voltage between the component to be measured and a standard current detection resistor by adopting a voltage follower, isolating to obtain a low-impedance output voltage, and inputting the low-impedance output voltage to a multipath AD (Analog to Digital) converter; setting the integral constant of an analog integrator by adopting a measuring range switching switch, and performing analog integration on the amplified voltage by adopting the analog integrator; computing voltages across a component to be measured and exciting current passing through the component to be measured by adopting a singlechip to obtain the resistance value of the component to be measured; and measuring integral contact resistance. The system and the method are suitable for measuring contact resistance.

Description

technical field [0001] The invention relates to a resistance measuring system and a measuring method. Background technique [0002] Contact resistance measurement belongs to micro-resistance measurement. The basic principle of this type of measurement system is voltammetry, which can be subdivided into DC method, AC method and pulse method. [0003] In the DC method, a known constant current is used to excite the measured contact pair, and the measured resistance value is calculated by amplifying and measuring the contact pair voltage. In order to achieve a higher resolution, it is necessary to increase the amplification factor of the voltage amplifier, or increase the excitation current, which brings problems such as increased noise, poor stability, and increased energy consumption. [0004] In the AC method, the AC current is used to excite the measured contact pair, and the passive device—transformer is used as the voltage amplification element, which greatly reduces th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/08
Inventor 任万滨曹晟周志凯陈宇武剑
Owner HARBIN INST OF TECH