Unlock instant, AI-driven research and patent intelligence for your innovation.

Testing module, testing method, and testing system

A test module and test method technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve the effects of low functional test cost, high signal quality, and high convenience/elasticity

Inactive Publication Date: 2012-10-24
MEDIATEK INC
View PDF6 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Generally speaking, existing testing methods for testing the functions of chips use a circuit board (such as a load board) to carry the chip to be tested and additional testing-related circuit components (the is used to ensure that the desired test performance can be obtained), however, such a design will have some disadvantages / disadvantages. There must be a tradeoff between the available circuit area of ​​the component
Therefore, existing testing methods still have room for improvement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing module, testing method, and testing system
  • Testing module, testing method, and testing system
  • Testing module, testing method, and testing system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] Certain terms are used in the preceding claims and description to refer to particular components. Those skilled in the art should understand that manufacturers may use different terms to refer to the same component. The previous claims and this description do not use the difference in name as a way to distinguish components, but use the difference in function of components as a basis for distinction. References to "comprising" in the preceding claims and throughout the specification are open-ended terms and should be interpreted as "including but not limited to". In addition, the term "coupled" herein includes any direct and indirect means of electrical connection. Therefore, if it is described that the first device is coupled to the second device, it means that the first device may be directly electrically connected to the second device, or indirectly electrically connected to the second device through other devices or connection means. Two devices.

[0016] Such as...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a testing module, a testing method and a testing system. The testing module for generating an analog testing signal for a device under test includes a control circuit, a core circuit, and a connector. The core circuit is coupled to the control circuit, and arranged to generate the analog testing signal under control of the control circuit. The connector is coupled to the core circuit, and arranged to receive the analog testing signal generated from the core circuit and output the received analog testing signal. The disclosed testing module, the testing method and the testing system have lower cost of functionality testing, higher signal quality of the analog testing signal, smaller occupied circuit area, and higher convenience / flexibility.

Description

technical field [0001] The present invention relates to testing specific functions of a device, in particular to a test module for generating analog test signals to an external device under test, a related test method and a test system. Background technique [0002] Regarding the functional test of a chip including an analog-to-digital converter (ADC), an analog test signal needs to be input to an analog input pin of the chip. Generally speaking, a sine wave test signal is generally used as the analog test signal to confirm whether the chip can meet the specification and function requirements required by the actual application. When the frequency of the sine wave test signal becomes higher, the signal quality requirements of the sine wave test signal will also become more stringent. In addition, the frequency and / or voltage swing of the sine wave test signal ( voltage swing) may also need to be adjusted during functional testing. [0003] Generally speaking, existing testi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCH03M1/1071G01R31/3167G01R31/00
Inventor 王景正石俊杰
Owner MEDIATEK INC