Integrated circuit turning device and control method

Abstract

The invention relates to the field of integrated circuit test equipment and aims at providing an integrated circuit turning device and a control method. The integrated circuit device has high integrated circuit turning efficiency, is favorable for the organization of integrated circuit test flow line operation and comprises a rotating seat, a rotating driving mechanism, a baffle plate, a feeding rail and a base, wherein the rotating seat is provided with a rotating shaft and at least two integrated circuit accommodating through holes distributed in the circumferential direction, the baffle plate is provided with a material discharge through hole, the rotating shaft is pivoted with the base, the feeding rail and the baffle plate are respectively positioned at the two opposite sides of the rotating seat and are fixedly connected with the base, the rotating driving mechanism is respectively and fixedly connected with the rotating seat and the base, the integrated circuit turning device is provided with a material conveying mechanism and a rotating angle detecting mechanism, the material conveying mechanism is used for controlling the feeding rail to convey materials to the rotating seat, and the rotating angle detecting mechanism is used for detecting the rotating angle of the rotating seat. The integrated circuit turning device has the advantages that the integrated circuit turning efficiency is high, in addition, the flow line operation of the integrated circuit test can be favorably organized, and in addition, the control method is simple and practical.

Description

technical field [0001] The invention relates to the field of integrated circuit testing equipment, in particular to an integrated circuit flipping device and a control method which have high integrated circuit flipping efficiency and are conducive to organizing integrated circuit testing flow operations. Background technique [0002] Integrated circuits need to carry out multiple tests, some tests need to be tested from the top surface of the integrated circuit, and some tests need to be tested from the bottom surface of the integrated circuit; Most of the circuits are produced in batches, and the workload of flipping is relatively large; the efficiency of manual flipping is low and it is not conducive to organizing integrated circuit testing assembly lines; Therefore, it is an urgent problem to design an integrated circuit flipping device and control method that has high efficiency of flipping integrated circuits and is conducive to organizing integrated circuit testing ass...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to overcome the current deficiencies in manual integrated circuit flipping, which is low in efficiency and unfavorable for the organization of assembly line operations for integrated circuit testing, and to provide an integration of integrated circuit assembly with high efficiency for integrated circuit flipping and assembly of integrated circuit testing. Circuit flipping device and control method

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