Integrating sphere detector

A detector and integrating sphere technology, applied in the field of optical parameter testing, can solve the problem of low optical power density of diffuse coating, and achieve the effect of solving the problem of accurate measurement

Active Publication Date: 2012-12-12
BEIJING INST OF OPTO-ELECTRONIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing integrating sphere is only suitable for measuring light with low optical power density, and its diffuse coating can withstand low optical power density
For the third type of light, there is currently no instrument that can measure it effectively

Method used

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Embodiment 1

[0032] Embodiment 1 of the present invention provides an integrating sphere detector, including a hollow spherical shell, a light entrance hole and a sampling hole arranged on the hollow spherical shell, and a cooling device attached to the outside of the hollow spherical shell , for cooling the hollow spherical shell.

[0033] The cooling device can at least have the following implementation forms: use liquid cooling, use refrigeration units for cooling or use semiconductor refrigerators for cooling, and the present invention does not limit the cooling form.

[0034] The integrating sphere detector provided by Embodiment 1 of the present invention has an integrating sphere that can receive light with any divergence angle; it also has a cooling device that can take away the heat generated by the integrating sphere at any time during the use of the integrating sphere detector, thereby Meet the measurement requirements of light with different powers. The integrating sphere dete...

Embodiment 2

[0036] figure 1 The schematic diagram of the integrating sphere detector provided for the second embodiment of the present invention, combined below figure 1 Embodiment 2 of the present invention will be described in detail. Embodiment 2 of the present invention provides an integrating sphere detector, which includes a hollow spherical shell 1, and a light entrance hole 2 and a sampling hole 3 arranged on the hollow spherical shell, and also includes a cooling device 4 attached to the The outer side of the hollow spherical shell 1 is used for cooling the hollow spherical shell 1 .

[0037] A preferred implementation of the cooling device 4 is as follows: the cooling device 4 includes an outer spherical shell 5, which is covered on the outside of part or all of the hollow spherical shell 1, and a cooling channel 6 is formed between the outer spherical shell 5 and the hollow spherical shell 1, and the outer spherical shell 5 The shell 5 is provided with a coolant inlet 7 and a...

Embodiment 3

[0043] figure 2 The schematic diagram of the integrating sphere detector provided for the third embodiment of the present invention, combined below figure 2 Embodiment 3 of the present invention will be described in detail. The difference between the third embodiment and the second embodiment lies in the implementation of the cooling device. Embodiment 3 of the present invention provides an integrating sphere detector, which includes a hollow spherical shell 1, a light entrance hole 2 and a sampling hole 3 arranged on the hollow spherical shell 1, and a cooling device attached to the hollow spherical shell 1. The outer side of the spherical shell 1 is used for cooling the hollow spherical shell 1 .

[0044] An optional implementation of the cooling device is as follows: the cooling device includes a semiconductor refrigerator 9 , and the semiconductor refrigerator 9 is attached to the outside of part or all of the hollow spherical shell 1 for cooling the hollow spherical s...

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PUM

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Abstract

The invention discloses an integrating sphere detector which comprises a hollow spherical shell, an incidence hole and a sampling hole. The incidence hole and the sampling hole are arranged on the hollow spherical shell. The integrating sphere detector further comprises a cooling device. The cooling device attached to outside of the hollow spherical shell is used for cooling the hollow spherical shell. The integrating sphere detector is applicable to measurement of various types of optical parameters, especially parameters of light with large divergence angle and high power, such as laser and other high-power light sources. Optical signals obtained are homogenized, and accordingly accurate measurement of optical parameters of multiple light emitters can be achieved.

Description

technical field [0001] Embodiments of the present invention relate to optical parameter testing technology, in particular to an integrating sphere detector. Background technique [0002] In the field of optics, according to the different luminous characteristics and structural characteristics of the measured object, the optical parameters of the following types of light are mainly measured: the first is light with a small divergence angle; the second is light with a large divergence angle and low power ; The third is light with large divergence angle and high power. Optical parameters include light intensity information, spectrum information, and waveform information. [0003] For the first type of light, a photodetector can be used for measurement. The shape of the photosensitive surface of the photodetector is usually planar or conical, which can be used to test parallel light or light signals with small divergence angles. The so-called photosensitive surface Refers to t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/04G01J3/02G01J11/00
Inventor 陆耀东徐磊位艳强高和平孙立明
Owner BEIJING INST OF OPTO-ELECTRONIC TECH
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