Pick and place apparatus for testing separator

A technology for testing sorting machines and pick-and-place devices, which is applied in semiconductor/solid-state device testing/measurement, sorting, electrical components, etc. It can solve problems such as difficulty in controlling movement, rising production costs, and increased inertia of pick-and-place devices, achieving Ensure design freedom, reduce production cost, and easily control the effect

Active Publication Date: 2012-12-19
TECHWING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] First, because the servo motor is expensive, the unit production cost of the equipment increases (roughly there are at least two pick-and-place devices in a test sorter)
[0014] Second, if the operator at the work site is not familiar with the operation of changing the control value of the servo motor or makes a mistake, the desired interval adjustment cannot be achieved.
[0015] Third, because of the heavy servo motor (including the attached pulley, etc.), the inertia of the pick-and-place device increases, making it difficult to control the movement

Method used

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  • Pick and place apparatus for testing separator
  • Pick and place apparatus for testing separator
  • Pick and place apparatus for testing separator

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0042] figure 1 and figure 2 It is a front view and a rear view of a pick-and-place device 100 for a test handler (hereinafter simply referred to as "pick-and-place device") according to the first embodiment of the present invention.

[0043] Such as figure 1 and figure 2 As shown, the pick-and-place device 100 includes eight picker modules 111 to 118 , a pair of first guide rails 121 , 122 , a cam plate 130 , a pair of second guide rails 141 , 142 , a cylinder 150 , a stopper 160 and the like.

[0044] The eight picker modules 111 to 118 are respectively movable horizontally and each have at least one picker P for gripping a semiconductor component. Reference, figure 1 and figure 2 Restricted by the front view and the rear view, it is only shown that there is only one picker P on one picker module 111 / 112... / 118, but according to the implementation needs, multiple The picker P is unquestionable, in fact, in this embodiment, it is also assumed that one picker module 1...

no. 2 example

[0065] Figure 8a and Figure 8b The cam plate 830 and the stop member 860 applied to the pick-and-place device of the second embodiment of the present invention are respectively shown.

[0066] like Figure 8a As shown, the cam plate 830 of this embodiment has a plurality of incomplete first open cam grooves 831a to 838a with open upper sides, and has a Figure 8b The reinforcing rib R of the limiting part 860. In addition, a step is formed on the surface of the cam plate 830 on which the stopper 860 is installed, so that the stopper 860 can be properly installed.

[0067] and, if Figure 8b As shown, the limiting member 860 of this embodiment has a plurality of second open cam grooves 861 a to 868 a with open lower sides.

[0068] That is, the first open cam grooves 831a / ... / 838a and the second open cam grooves 861a / ... / 868a are opened toward the facing sides, respectively, so that as Figure 9 As shown, when the stop member 860 is set, the first open cam groove 831a / ....

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PUM

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Abstract

The invention relates to a pick and place apparatus for a testing separator. According to the invention, through further arranging limiting parts, gap adjusting range of a cap plate is limited, wherein the gap adjusting range is used for adjusting gaps among a plurality of picker modules of the pick and place apparatus, so that the gap adjusting range among the picker modules can be easily changed.

Description

technical field [0001] The present invention relates to a pick-and-place device for moving a semiconductor element to a desired position after gripping the semiconductor element in a test handler. Background technique [0002] The test sorter is to load multiple semiconductor components manufactured through a predetermined manufacturing process from the customer tray (CUSTOMER TRAY) to the test tray (TEST TRAY), and support multiple semiconductor components loaded on the test tray so that it can A device for testing (TEST) by a tester (TESTER), classifying semiconductor components according to grades according to the test results, and unloading (UNLOADING) the semiconductor components from the test tray to the user tray has been disclosed in many publications. [0003] In addition to the above-mentioned user trays and test trays, the test handler is equipped with an aligner (ALIGNER) formed in the loading section or a buffer (BUFFER) for storing and loading redundant semicon...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/00H01L21/683H01L21/66
Inventor 罗闰成权宁镐
Owner TECHWING CO LTD
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