Testing method and testing device of organic light emitting diode (OLED) substrate

A technology of a testing device and a testing method, applied in the field of OLED display, can solve the problems of inability to clearly determine the driving circuit of a pixel unit, high cost, complicated testing process, etc.

Active Publication Date: 2012-12-19
BOE TECH GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with this method, when the OLED fails to light up, on the one hand, it is impossible to clearly determine whether it is a defect in the pixel unit or a defect in the drive circuit. On the other hand, the test method has a long production cycle, complicated testing process, and high cost

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  • Testing method and testing device of organic light emitting diode (OLED) substrate
  • Testing method and testing device of organic light emitting diode (OLED) substrate
  • Testing method and testing device of organic light emitting diode (OLED) substrate

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Embodiment Construction

[0030] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0031] The embodiment of the present invention provides a test device for an OLED substrate, such as figure 1 As shown, the testing device includes a signal loading substrate 11 and a signal source 12.

[0032] Wherein, the signal loading substrate 11 includes a signal line access module 111 and a test signal access module 112.

[0033] The signal line access module 111 is used to connect to the data line, scan line, power line and cathode l...

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Abstract

The embodiment of the invention provides a testing device and a testing method of an organic light emitting diode (OLED) substrate, which can shorten the test period of the OLED substrate and reduce the test cost. The device comprises an information loading substrate and a signal source; the signal loading substrate comprises a signal wire access module and a test signal access module, wherein the signal wire access module is used for being respectively connected with a data wire, a scanning wire, a power supply wire and a cathode wire of the OLED substrate; the testing signal access module is used for being connected with an external signal source, and providing a test signal respectively for the data wire, the scanning wire, the power supply wire and the cathode wire through the signal wire access module; and the signal source is used for being connected with the test signal access module of the signal loading substrate, and providing a test signal respectively for the data wire, the scanning wire, the power supply wire and the cathode wire through the signal loading substrate. The embodiment of the invention is applicable to the manufacturing field of the OLED substrate.

Description

Technical field [0001] The present invention relates to the field of OLED display technology, in particular to a test method and device for an OLED substrate. Background technique [0002] The organic electroluminescent display using OLED (Organic Light-Emitting Diode, organic light-emitting diode) is a new type of flat panel display device. Due to its simple preparation process, low cost, fast response speed, and easy realization of color display, it has obtained widely used. Furthermore, as the process technology of thin film transistors and the material properties of OLEDs continue to improve, OLEDs are becoming more and more popular. [0003] In order to reduce the defective rate of products before they leave the factory, testing of OLED substrates is indispensable. In the prior art, in order to test the OLED substrate, it is first necessary to vapor-deposit the OLED substrate, and then bind the drive circuit, scan the pixel units of the substrate row by row through the drive...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00
Inventor 梁逸南
Owner BOE TECH GRP CO LTD
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