A Method for Determining Natural Landmarks and Landing Areas Based on Pixel Distinguishability
A technology of area determination and pixel points, which is applied in the field of deep space detection, can solve the problem of being unable to distinguish surrounding points, and achieve fast and reliable determination
Inactive Publication Date: 2016-04-06
BEIJING INSTITUTE OF TECHNOLOGYGY
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And the points in the flat area (such as figure 1 5, 6, 7 in ), which are similar to the surrounding points and basically cannot be distinguished from the surrounding points
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[0028] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
[0029] The flow chart of the natural landmark detection and landing area determination method based on pixel point distinguishability proposed by the present invention is as follows figure 2 As shown, the specific implementation steps are as follows:
[0030] Step 1: Image Acquisition
[0031] The camera is installed under the lander, and can continuously obtain images of the ground during the descent of the lander.
[0032] Step 2: Calculate the distinguishability of pixels
[0033] Let p represent a pixel in the image, its coordinates are (px, py), and its pixel value is I(px, py), then the distinguishability of pixel p is the distinguishability of p and other pixels in its neighborhood . Let the neighborhood of pixel p be N p , N p It is a rectangle with pixel p as the center, and its length and width can be set according to the actual situa...
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The invention relates to a pixel distinguishbility-based natural guide post and a method for determining a landing area, and belongs to the field of deep space exploration. According to the method, on the basis of the characteristic that the distinguishbility of pixel points in a flat area in an image and pixel points in an area which is adjacent to the flat area is low and the distinguishbility of pixel points in areas of meteor craters, rocks and the like and pixel points in areas which are adjacent to the areas is high, pixel points of which the distinguishbility is lower than a preset threshold value are used as candidate points of the landing area, pixel points of which the distinguishbility is higher than the preset threshold value are used as candidate points of the natural guide post, and a set of the candidate points of the natural guide post within a preset radius is used as the natural guide post by calculating the distinguishbility of each pixel point in the image; and morphological expansion is performed on the candidate points of the natural guide post and pixels at the image boundary, the candidate point of the landing area which is covered by expansion operation finally is used as the center of a circle, and distance between the center of the circle and the candidate point, which is close to the center of the circle, of the natural guide post is used as radius to obtain the maximum landing circle. By the method, the landing area can be determined quickly and reliably.
Description
technical field [0001] The invention belongs to the field of deep space detection and relates to related technologies of image processing. Background technique [0002] Natural landmark detection and landing area determination are important issues in the field of deep space exploration. In the process of deep space exploration, since the lander is very far away from the earth, the signal transmission has a large delay, so the lander needs to be able to determine its own attitude and position autonomously and find the landing area autonomously. [0003] Natural signposts refer to reference objects or patterns that exist in the environment, are not artificially set, and can be used to identify different environments. Natural landmark detection plays an important role in determining the attitude and position of the lander for autonomous navigation. Most of the existing natural landmark detection methods are aimed at various terrains on the surface of the planet (such as crate...
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IPC IPC(8): G06K9/00
Inventor 裴明涛王亚菲
Owner BEIJING INSTITUTE OF TECHNOLOGYGY