Tandem mass spectrometry analysis method performed in ion traps
An analysis method, tandem mass spectrometry technology, applied in the direction of material analysis, material analysis, and measuring devices through electromagnetic means, can solve demanding and complex problems, and achieve the effect of enriching information and simplifying experimental devices and methods
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2013-02-20
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of mass analysis, and specifically relates to a method for realizing tandem mass spectrometry analysis in an ion trap mass spectrometer, which realizes ion excitation and collision-induced dissociation by applying a dipole excitation voltage of an asymmetric waveform. Background technique
[0002] As a powerful analytical technique, mass spectrometry can achieve qualitative and quantitative analysis of compounds, and is widely used in pharmaceutical analysis, environmental monitoring, national security, forensic science, proteomics and other fields. As we all know, mass spectrometry can characterize and analyze the structure of compounds through tandem mass spectrometry (Tandem MS) analysis. The analysis process of tandem mass spectrometry is as follows: the first stage is isolation. For the ions in the sample to be analyzed, ions with a specific mass-to-charge ratio (m / z) are selected to isolate them, and t...
Examples
Embodiment 1
[0053] This technical scheme uses a digital square wave voltage to drive the ion trap, and realizes the collision-induced dissociation of parent ions by changing the duty cycle of the dipole excitation voltage. This scheme has been verified experimentally, and the specific content is as follows.
[0054] The ion trap in this scheme selects the rectangular ion trap for testing. The instrument experiment platform is shown in Figure 2. The electrospray ionization source-rectangular ion trap mass spectrometer system (ESI-RIT-MS) is designed and manufactured by our laboratory. The instrument is composed of a three-stage differential vacuum system, and the vacuum degree in the third-stage vacuum chamber where the ion trap is located can reach 3×10 -3 Pa. The ions generated by the electrospray ionization source enter the secondary vacuum chamber through the sampling cone, and then enter the rectangular ion trap through a quadrupole ion guide with a length of 200 mm to complete the m...