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Earphone and method for detecting earphone wearing state

A technology of wearing status and earphones, which is applied in the direction of handset/earphone accessories, electrical components, etc., and can solve problems such as misjudgment of earphone wearing status detection schemes

Active Publication Date: 2013-03-27
QINGDAO GOERTEK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention provides an earphone and a method for detecting the wearing state of the earphone to solve the misjudgment problem of the existing earphone wearing state detection scheme

Method used

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  • Earphone and method for detecting earphone wearing state
  • Earphone and method for detecting earphone wearing state
  • Earphone and method for detecting earphone wearing state

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Embodiment Construction

[0039] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0040] figure 1 It is a structural diagram of the earphone in Embodiment 1 of the present invention. Such as figure 1 As shown, the earphone 100 includes: a controller 101, a reference sensor 102 connected to the controller 101, a state judgment sensor 103 connected to the controller 101, and a production line test capacitance value connected to the controller 101 and stored with the reference sensor 102 and the memory 104 of the production line test capacitance value of the state judging sensor 103 . Both the reference sensor 102 and the state judging sensor 103 are capacitive sensors. The reference sensor 102 is arranged in a position isolated from the external environment in the earphone 100, so as to prevent the capacitance valu...

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PUM

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Abstract

The invention discloses an earphone and a method for detecting an earphone wearing state. The earphone comprises a controller, a reference sensor, a state judging sensor and a memorizer memorized with production line testing capacitance values of the reference sensor and the state judging sensor, wherein the reference sensor and the state judging sensor are connected with the controller. The reference sensor and the state judging sensor are capacitance-type sensors, and the reference sensor is arranged at the position in the earphone isolated from the outside environment. When the earphone is started up, the controller confirms influencing parameters of the environment to capacitance values of the capacitance-type sensors according to a detected capacitance value of the reference sensor and a production line testing capacitance value of the reference sensor and judges the earphone wearing state according to the influencing parameters of the environment to capacitance values of the capacitance-type sensors, a detected capacitance value of the state judging sensor and a detected production line testing capacitance value of the state judging sensor. By means of the scheme, the erroneous judgment problem of the earphone wearing state of the capacitance-type sensors can be effectively solved.

Description

technical field [0001] The invention relates to the technical field of earphones, in particular to an earphone and a method for detecting the wearing state of the earphone. Background technique [0002] In the existing bluetooth headsets, headsets and other products, capacitive sensors are used to detect the wearing state of the headset: whether it is worn or not, the principle is through the change of the capacitance value of the capacitive sensor during the process of putting on and taking off the headset To determine whether the headset is worn. That is to say, the capacitive sensor must detect the capacitance change to judge the state of the earphone. If the user puts the headset on the ear first and then turns it on, a misjudgment will occur, and the headset will think that the user is not wearing it. Some earphones have made corresponding improvements, such as writing the capacitance value of the last time it was worn into the memory, and using it as a reference for ...

Claims

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Application Information

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IPC IPC(8): H04R1/10H04R29/00
Inventor 宋国明郭建光陈小艳
Owner QINGDAO GOERTEK
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