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Test method and test device for central processing unit parameters

A central processing unit and testing equipment technology, applied in the direction of power supply testing, data processing power supply, electrical digital data processing, etc., can solve the problems of poor accuracy and reliability, and achieve the effect of improving accuracy and reliability

Inactive Publication Date: 2013-04-10
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the technical problem of poor accuracy and reliability of the performance parameter test of the central processing unit power supply in the prior art, a test method and testing equipment that can improve the accuracy and reliability of the performance parameter of the central processing unit power supply are provided

Method used

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  • Test method and test device for central processing unit parameters
  • Test method and test device for central processing unit parameters
  • Test method and test device for central processing unit parameters

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Embodiment Construction

[0017] The method for testing the parameters of the central processing unit of the present invention and the testing equipment thereof will be described in detail below in conjunction with the accompanying drawings.

[0018] see figure 1 , which is a schematic structural diagram of the central processing unit parameter testing equipment of the present invention. Wherein, the power supply 10 provides a power signal for the testing device 20 . The testing device 20 includes a main circuit board 200 , a connector 300 and a testing module 400 . The main circuit board 200 , the connector 300 and the test module 400 cooperate with each other to test the power performance parameters of a central processing unit 50 to be tested. It should be noted that the power performance parameters mentioned in this embodiment refer to the parameters representing driving performance such as the voltage value, current or power value received by the power pin 501 of the CPU 50 .

[0019] The main ...

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Abstract

The invention provides a test method and a test device for central processing unit parameters. The test device comprises a main circuit board, a connector and a test module. The connector and the test module are arranged on the main circuit board; the test module is electrically connected with the main circuit board through the connector; the main circuit board, the connector and the test module are matched for testing power supply performance parameters of a central processing unit to be tested; the connector comprises a plurality of connection ends which comprise at least one first power supply end, and the at least one first power supply end is used for being connected with at least one power supply pins of the central processing unit; and the test module is used for testing power supply performance parameters of the at least one power supply end corresponding to the central processing unit.

Description

technical field [0001] The invention relates to a testing method and testing equipment for testing central processing unit parameters. Background technique [0002] Usually, the performance parameters of the central processing unit (Central Processing Unit, CPU) and other integrated chips with data processing functions, such as voltage, current, power and other nominal values, are marked in the database of the chip provided by the manufacturer ( Database). However, the nominal values ​​of the performance parameters marked in the database are often different from the actual working performance parameters of the chip when it is actually working, especially the CPU power performance parameters, such as input voltage, input current or input power. If the nominal values ​​of the listed performance parameters are used directly, then when these chips are subsequently used for circuit board design, the circuit modules that cooperate with the chip will often appear to work unstable...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40G01R21/06G01R19/00
CPCG06F1/28G06F11/3024G06F11/3062G06F11/3093
Inventor 罗奇艳陈鹏刘丹丹童松林
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD