Check patentability & draft patents in minutes with Patsnap Eureka AI!

Semiconductor package

A technology of semiconductors and packages, which is applied in the field of semiconductor packages and can solve problems such as short interconnection wires

Active Publication Date: 2013-04-24
TAIWAN SEMICON MFG CO LTD
View PDF8 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The resulting flip-chip package is much smaller than traditional carrier-based systems, making the interconnection wires potentially much shorter due to the chip being positioned directly above the external circuitry

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor package
  • Semiconductor package
  • Semiconductor package

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Now, reference will be made to the exemplary embodiments described in detail with reference to the accompanying drawings. The same reference numerals are used in the drawings and description to refer to the same or similar parts. In the drawings, shapes and thicknesses may be exaggerated for clarity and convenience. This description refers in particular to elements forming part of a device according to the invention, or cooperating more directly with the device. It is to be understood that elements not specifically shown or described may take various forms well known to those skilled in the art. Also, when a layer is referred to as being on another layer or on a substrate, it can be directly on the other layer or on the substrate, or intervening layers may also be present.

[0028] Reference throughout this specification to "one embodiment" or "an embodiment" means that at least one embodiment includes a particular component, structure or characteristic described with...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A semiconductor package includes a workpiece with a conductive trace and a chip with a conductive pillar. The chip is attached to the workpiece and a solder joint region is formed between the conductive pillar and the conductive trace. The distance between the conductive pillar and the conductive trace is less than or equal to about 16 mum.

Description

technical field [0001] The present invention relates generally to the field of semiconductors, and more particularly, to semiconductor packages. Background technique [0002] An integrated circuit chip includes semiconductor devices formed over a substrate, such as a semiconductor wafer, and includes metallized contact pads that provide the electrical interface to the integrated circuit. Bonding bumps are part of the interconnect structure in integrated circuits. The bumps provide an interface to the integrated circuit device through which electrical connections to the device can be made. The technique of providing a connection between the internal circuitry of a chip, such as a circuit board, other chips, or a wafer, including wire bonding, in which wires are used to connect the chip's contact pads to external circuitry, and possibly also known in the art. other technologies. A more recent chip-attachment technique, known as flip-chip technology, uses solder bumps deposi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/488H01L21/48H01L21/60
CPCH01L21/48H01L23/488H01L23/48H01L2224/13005H01L24/13H01L24/81H01L2224/1146H01L2224/11849H01L2224/13014H01L2224/13082H01L2224/1601H01L2224/81191H01L2224/81203H01L2224/81815H01L2224/8191H01L2224/13012H01L2224/16104H01L2924/13091H01L2924/1306H01L2924/1305H01L2224/1308H01L2224/16238H01L2224/05572H01L24/16H01L2924/206H01L2924/00014H01L2924/00012H01L2924/00
Inventor 郑明达林志伟黄贵伟蔡钰芃林俊成刘重希
Owner TAIWAN SEMICON MFG CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More