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Testing method for performance of network device with high-rate port by utilizing low-rate port

A technology of port testing and testing methods, which is applied in data exchange networks, digital transmission systems, electrical components, etc., can solve the problem of high testing costs and achieve the effect of reducing testing costs

Inactive Publication Date: 2013-05-15
SHENZHEN NEW GREENNET TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to provide a network equipment performance testing method using a low-speed port to test a high-speed port, so as to make up for the shortcomings of the traditional testing method, and can realize testing a high-speed device to be tested port with a low-speed network tester port , so as to complete the high-speed port performance test of the device under test, and solve the problem of high test cost in traditional test methods

Method used

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  • Testing method for performance of network device with high-rate port by utilizing low-rate port
  • Testing method for performance of network device with high-rate port by utilizing low-rate port

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Embodiment Construction

[0022] The present invention will be further described in detail with an embodiment below, but it should be noted that the protection scope of the present invention is not limited thereto.

[0023] For ease of description, we assume that the device to be tested has 24 Gigabit ports and 2 10 Gigabit ports, but the network tester only has 10 Gigabit ports. We need to test the forwarding performance of the 10 Gigabit ports. The specific test method is as follows: figure 1 Shown:

[0024] Step S1, connect two devices to be tested through high-speed ports, the interconnection ports are HPA1 and HPB1;

[0025] Step S2, connect the two devices under test with multiple low-speed ports, the interconnection ports are LPA1, LPB1, LPA2, LPB2, ..., LPA10, LPB10;

[0026] Step S3, connecting another 10 ports LPA11, LPA12, ..., LPA20 of the device A to be tested with 10 ports TP1, TP2, ..., TP10 of the network tester;

[0027] Step S4, close the MAC address aging function of the device und...

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Abstract

The invention discloses a testing method for performance of a network device with a high-rate port by utilizing a low-rate port. The testing method comprises the following testing steps of: connecting high-rate ports of two devices to be tested, connecting a part of the low-rate port of the device A to be tested with the low-rate port of the device B to be tested, connecting the other part of the low-rate port of the device A to be tested with a port of a network tester, turning off an MAC address aging function, a spanning tree function and other loop detection functions of the devices to be tested, turning on an unknown unicasting message forwarding function, modifying an MAC address learning style of the devices to be tested into an IVL style and restarting the devices to be tested after storing configuration, creating multiple VLANs (Virtual Local Area Networks) in the devices to be tested, sending unicasting messages at a 100% rate respectively by using each port of the network tester to verify the message forwarding performance of the devices to be tested, analyzing testing data, outputting a testing report and providing description of performance indicators of the devices to be tested. The testing method can reduce the testing cost of enterprises.

Description

technical field [0001] The invention relates to a method for testing the performance of network equipment, in particular to a method for testing the performance of network equipment using a low-speed port to test a high-speed port. Background technique [0002] In daily network product performance testing, sometimes the following situation exists: the network tester only has Gigabit ports, but the device under test supports 10G ports; or the network tester supports 10G ports, but the device under test supports 40G ports. According to the traditional test method, there is no way to test the port performance of the device under test by using the existing conditions. Either the port performance test of the device under test is not performed, or the test instrument corresponding to the port rate is purchased, and the test cost is greatly increased. Therefore, , both methods are not conducive to the company's product development and quality control. Contents of the invention ...

Claims

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Application Information

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IPC IPC(8): H04L12/26
Inventor 黄小春
Owner SHENZHEN NEW GREENNET TECH