On-site measuring device and scanning probe automatic centering method based on scanning tunneling effects
A technology for scanning tunnels and scanning probes, which is applied in the field of ultra-precise on-site measurement, can solve the problems of secondary clamping errors and the inability to realize automatic centering of probes, etc., so as to improve processing efficiency, realize automatic centering measurement functions, compact effect
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[0019] Below in conjunction with accompanying drawing, this patent is further described.
[0020] combine figure 1 , figure 2 As shown, the structure of the in-situ measurement device based on the scanning tunnel effect consists of: L-shaped machine base 12, air bearing spindle 1, Z-direction horizontal movement axis 2, X-direction horizontal movement axis 3, marble support 4, two-dimensional precision manual adjustment Table 5, Y-direction precision servo motor 6, probe fixture 7, piezoelectric ceramics 8, pre-signal modulation unit 9, scanning probe 10, workpiece 11 to be measured. The assembly position relationship of each part of the structure: the L-shaped machine base is equipped with an air-floating spindle 1, a Z-direction horizontal movement axis 2, and an X-direction horizontal movement axis 3. The marble frame 4 is fixed on the X-direction horizontal movement axis 3, on which there are sequentially provided a two-dimensional precision manual adjustment platform 5...
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