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Electronic device error detecting system and method

An error detection, electronic device technology, applied in the field of detection systems, can solve problems such as unfavorable problem analysis, inability to effectively capture detailed processes, etc., to achieve the effect of convenient analysis

Inactive Publication Date: 2013-06-19
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] After the server and other electronic devices are assembled, they need to go through a comprehensive functional test to determine whether they are good products, and the server test is mainly to detect various conditions that may occur when the server is running, and then solve the problems that occur. However, Traditional testing methods cannot effectively capture the detailed process of testing, which is not conducive to analyzing and solving problems that occur

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  • Electronic device error detecting system and method
  • Electronic device error detecting system and method

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Embodiment Construction

[0017] see figure 1 A preferred embodiment of the electronic device error detection system of the present invention includes a host computer 10, a processing unit 20, a storage unit 30, a latch unit 40, a power supply status detection unit 51, a temperature detection unit 52 and An error signal detection unit 53 , the detection system is used to detect a device under test 80 .

[0018] In one embodiment, the host computer 10 is a computer, the host computer 10 is connected to the processing unit 20 through a first interface 11, the processing unit 20 includes a second interface 21, and the second interface 21 is connected to the first interface 21. An interface 11 is connected, and the second interface 21 is the same type of interface as the first interface 11 , such as a serial interface or a USB interface.

[0019] The storage unit 30 is connected to the processing unit 20, the latch unit 40 is respectively connected to the storage unit 30, the power condition detection uni...

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Abstract

Provided is an electronic device error detecting system. The electronic device error detecting system is used for detecting a detected device, and comprises an upper computer, a storage unit, a power supply condition detection unit, a temperature detection unit and an error signal detection unit. The power supply condition detection unit, the temperature detection unit and the error signal detection unit are all connected with the detected device. The power supply condition detection unit is used for detecting power conditions of the detected device and generating corresponding power condition signals. The temperature detection unit is used for detecting temperature conditions of the detected device and generating corresponding temperature condition signals. The error signal detection unit is used for detecting run-time error signals of the detected device. The power condition signals, the temperature condition signals and the run-time error signals are all stored in the storage unit. The upper computer is used for reading and analyzing the signals in the storage unit. The invention further provides an electronic device error detecting method.

Description

technical field [0001] The invention relates to a detection system and method, in particular to a detection system and method for detecting errors of electronic devices. Background technique [0002] After the server and other electronic devices are assembled, they need to go through a comprehensive functional test to determine whether they are good products, and the server test is mainly to detect various conditions that may occur when the server is running, and then solve the problems that occur. However, Traditional testing methods cannot effectively capture the detailed process of testing, which is not conducive to analyzing and solving problems that occur. Contents of the invention [0003] In view of the above, it is necessary to provide an electronic device error detection system and method capable of latching signals. [0004] An electronic device error detection system is used to detect a device under test. The electronic device error detection system includes a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG01R31/2868G01R31/2874
Inventor 郭利文
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD