Spectrum test device and method

A spectrum test and spectrum technology, which is applied in the field of spectrum test, can solve the problems that the light source cannot be tested directly, and the spectrum takes a long time, so as to reduce the cost and avoid the effect of device test light source
CN103217218AActive Publication Date: 2013-07-24BOE TECH GRP CO LTD +1
6 Cites 14 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
BOE TECH GRP CO LTD
Publication Date
2013-07-24

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention discloses a spectrum test device and a spectrum test method. The device comprises an integrating sphere (501), a light source (502), a baffle (503) and a test lens (504), wherein the integrating sphere (501) is hollow, the top of the integrating sphere (501) is provided with a light outlet, the inner wall of the integrating sphere (501) is coated with a diffuse reflection layer, and diffusion of all points of the diffuse reflection layer is uniform to evenly diffuse light rays; the light source (502) is arranged in the center of the integrating sphere (501) and emits the light rays when powered on; the baffle (503) is located between the light outlet and the light source (502) to prevent the light rays emitted from the light source (502) from shooting out from the light outlet before being diffused; and the test lens (504) is located above the light outlet and used for testing the light rays from the light outlet and obtaining the spectrum of the light rays to solve the problems that in a traditional backlight spectrum test method, a light source cannot be directly tested and time used in obtaining the spectrum is long.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the technical field of spectrum testing, in particular to a spectrum testing device and method. Background technique

[0002] When manufacturing liquid crystal displays, it is necessary to test the backlight spectrum to obtain the backlight spectrum and match it with the color filter spectrum of the panel. For the white light and RGB (red, Green, Blue, red) The color coordinates and color gamut of the green and blue) screen are simulated and predicted. According to the difference between the simulated color coordinates and the central color coordinates (MNT: 0.313, 0.328; TV: 0.280, 0.290), the LED (Light Emitting Diode, luminescent The central color block of the diode) light bar determines the light source information such as LED phosphor powder that needs to be used to meet the color gamut and other parameters. When analyzing the liquid crystal display, the optical parameter information such as the fluorescent powder of the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More