Method and device for detecting parallelism of camera chip
A camera chip and detection method technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of poor camera imaging quality, difficulty in distinguishing by human eyes, low efficiency, etc., achieve high precision, simple calibration, and avoid damage Effect
Active Publication Date: 2013-08-07
深圳华用科技有限公司 +1
View PDF5 Cites 8 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Due to the special camera chip, the contact method cannot be used for measurement, so the traditional contact parallelism measuring instrument is not applicable
At present, the method of detecting the parallelism between the camera chip and the circuit board is to rely on the human eye to observe. Since the human eye observation is very subjective, it can only detect the situation where the camera chip and the circuit board have a large inclination angle. It is difficult for the human eye to detect a small inclination. It can be distinguished that only when the camera is tested as a whole, the parallelism of the chip can be judged according to the imaging quality
If the camera chip is slightly out of parallel with the circuit board, resulting in poor image quality, the camera needs to be disassembled and the chip reattached, which is inefficient.
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 2
[0048] Embodiment 2, the difference between this embodiment and embodiment 1 is that only a set of lasers and a set of cameras are used. In this embodiment, only a set of lasers and a set of cameras are used. The laser is on the same plane, the plane S1 where the camera chip is located and the plane S2 where the circuit board is located are on a horizontal plane, and a mechanism for rotating the circuit board in a vertical direction is also included.
[0049] When measuring the angle between L1 and straight line L2 Tangent: Afterwards, rotate the relative position between the laser and the camera and the camera chip and the circuit board by a certain angle, generally 90 degrees, and then calculate the angle between the camera chip and the straight lines L3 and L4 on the circuit board.
[0050] Specifically include the following steps:
[0051] A. The step of setting the first measurement plane S3 that intersects both the plane S1 where the camera chip is located and the pl...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a method and a device for detecting parallelism of a camera chip. The method includes: adopting the mode of enabling linear lasers to project on the chip and a circuit board to obtain a same detection plane intersected with planes of the chip and the circuit board, calculating to obtain an included angle between two lines formed by intersecting of the detection plane and the chip as well as the detection plane and the circuit board, and finally obtaining the result about whether the camera chip and the circuit board are parallel or not through the above detection.
Description
technical field [0001] The invention belongs to the field of camera manufacturing, and in particular relates to a detection method and a detection device for detecting the parallelism between a camera chip and a circuit board in the process of producing a camera. Background technique [0002] Parallelism refers to the degree to which two planes or two lines are parallel. In the camera production process, the parallelism between the camera chip and the circuit board is an important parameter, which is directly related to the final image quality of the camera. Due to the special camera chip, the contact method cannot be used for measurement, so the traditional contact parallelism measuring instrument is not applicable. At present, the method of detecting the parallelism between the camera chip and the circuit board is to rely on the human eye to observe. Since the human eye observation is very subjective, it can only detect the situation where the camera chip and the circuit b...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26
Inventor 石楷弘卢宗庆廖庆敏刘军郭宏国王艳李立
Owner 深圳华用科技有限公司