Time measurement circuits, methods and systems

Abstract

The invention provides a circuit, method and system for time measurement. The circuit comprises a pulse generator, a first time to digital converter, a second time to digital converter and a measured value calibration unit. The pulse generator generates internal reference clock signals according to external reference clock signals under a calibration mode. The first time to digital converter is used for measuring the first code value of the external reference clock signals according to the internal reference clock signals under the calibration mode and measuring the time code value of data signals according to the external reference clock signals under a measuring mode. The second time to digital converter is used for measuring the second code value of the external reference clock signals according to the internal reference clock signals under the calibration mode. The measured value calibration unit carries out calibration on the time code value according to the first code value, the second code value and the period of the external reference clock signals. The circuit, method and system for the time measurement can improve time measurement accuracy.

Description

technical field [0001] The invention relates to circuit technology, in particular to a time measuring circuit, method and system. Background technique [0002] In many engineering measurement fields, the measurement of parameters such as speed, distance, and flow is usually converted into the measurement of time intervals, especially in the fields of communication, chip design, atomic physics, and astronomical observations. The requirements for time measurement accuracy are very high. Even a 1 microsecond measurement error can have serious consequences. [0003] Time interval measurement methods usually include pulse counting method, delay time interpolation method, time-to-digital conversion method, etc. Time-to-digital converter (Time-to-Digital Converter, TDC) is a device that converts pulse edge intervals into digital code values, including ring TDC and hierarchical structure TDC and other structures. figure 1 It is a schematic diagram of the circuit structure of the h...

AI Technical Summary

Problems solved by technology

[0005] The present invention provides a time measurement circuit, method and system, which are used to solve the problem of low measurement accuracy of existing time converters, and can improve the accuracy of time interval measurement

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