Quality map guide method and branch cutting method-based interferogram unwrapping method

A technology of interferometric phase diagram and interferometric phase, which is applied in image analysis, image data processing, instruments, etc., and can solve problems such as increased operation time, unfavorable unwrapped area images, and slow operation speed.

Inactive Publication Date: 2013-09-04
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

However, the operation speed of this algorithm is relatively slow, and the operation time increases exponentially with the increase of image size, which is not conducive to unwrapping images with large areas.

Method used

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  • Quality map guide method and branch cutting method-based interferogram unwrapping method
  • Quality map guide method and branch cutting method-based interferogram unwrapping method

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Embodiment Construction

[0062] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0063] The invention provides a method for unwrapping an interferometric phase graph based on a quality graph guidance method and a branch cutting method, comprising the following steps:

[0064] Step one, such as image 3 Shown, calculate the interferogram f O (x, y) residual point, set the branch tangent line according to the residual point, get as follows Figure 4 The branch tangent line distribution shown in f B (x, y);

[0065] The definition of residual points in the Goldstein branch cutting method is: if figure 1 As shown, the phase differences of four adjacent pixels are added clockwise, and the result of the addition becomes the residual, such as image 3 As shown, the points with positive residuals are positive residual points, and the points with negative residuals are negative residual points.

[0066] The phase difference is defined as:...

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Abstract

The invention discloses a quality map guide method and branch cutting method-based interferogram unwrapping method. The method comprises the following steps of primarily unwrapping an interferogram by adopting a branch cutting method to obtain an unwrapped phase diagram and a binary distribution map of unwrapped phases, finding non-unwrapped pixel points on a boundary line of a non-unwrapped area and an unwrapped area based on a branch cutting line distribution map in the branch cutting method and the binary distribution map of the unwrapped phases, finding a pixel point with the highest quality adjacent to the non-unwrapped pixel points on a branch cutting line according to a quality map, unwrapping pixels adjacent to the pixel point with the highest quality, which serves as a starting reference point, in the non-unwrapped area by using a quality map guide method, connecting the phases of disconnected areas on two sides by using a pixel phase on the branch cutting line, and unwrapping a small part of the disconnected areas separated by the branch cutting line by utilizing the quality map guide method. The size of an image to be unwrapped is greatly reduced, the calculation amount of the quality map guide method can be reduced, and the operation time is further reduced.

Description

technical field [0001] The present invention relates to, in particular, an interferometric phase graph unwrapping method based on a quality graph guidance method and a branch cutting method. Background technique [0002] Digital elevation extraction using interferometric technology has a wide range of applications in scientific research and surveying fields, such as synthetic aperture radar imaging, surface microscopic topography measurement, etc. Phase unwrapping is an important step in digital elevation model extraction using interferometry. [0003] In the process of interferometric height measurement, the phase value extracted from the interferometric image reflects the change of the surface topography of the object, but the phase value obtained by the phase extraction algorithm is expressed by the arc tangent function, and the phase value is compressed in [- π, π] range, while the phase change range of the surface topography of the object is usually far beyond the phas...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
Inventor 佟洁王霞王萌路陆金伟其
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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