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Potential distribution test method for wide-band large metal plate

A technology of potential distribution and test method, applied in the direction of measuring device, measuring electrical variable, measuring current/voltage, etc., can solve the problems of inaccurate results and difficulty in shielding interference by direct measurement of potential, so as to ensure the test accuracy and solve the problem of signal transmission. , test the effect of simple and convenient

Active Publication Date: 2016-03-16
CHINA SHIP DEV & DESIGN CENT
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a method for testing the potential distribution of a wide-band large metal plate, which solves the defects in the prior art that it is difficult to shield the interference by directly measuring the potential and the result is not accurate enough

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  • Potential distribution test method for wide-band large metal plate

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] figure 1 It is the connection diagram of the test method of the embodiment of the present invention, such as figure 1 As shown, the test method of the present invention includes a test cable, a preamplifier and a spectrum analyzer; the test cable includes an insulating layer, a shielding layer, and a twisted wire;

[0025] Connect one end of the shielding layer of the test cable to the point to be tested, and the surface of the point to be tested needs to be decontaminated for reliable electrical connection, and the other end is suspended in the air;

[0026] Connect the outer conductor of...

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Abstract

The invention discloses a method for testing potential distribution of a wide band large-scale metal plate. The method for testing the potential distribution of the wide band large-scale metal plate comprises testing cables, a pre-amplifier and a spectrum analyzer. The testing cables comprise insulating layers and shielding layers. The method mainly comprises the following steps that the shielding layer ends of the testing cables are in reliable electrical connection with the test points of the large-scale metal plate, and the other ends of the testing cables are hung in the air; the external conductor of the signal input end of the pre-amplifier is in reliable electrical connection with reference points, and the signal output end of the pre-amplifier is connected with the spectrum analyzer; the spectrum analyzer is set according to testing requirements; the potential distribution of the metal plate is acquired according to the result of the spectrum analyzer. The method carries out the test of the potential distribution of the wide band large-scale metal plate based on the shielding layers of the cables and the coupling mechanism of inner conductors, not only effectively solves the interference problem of complex electromagnetic environments, but also solves the transmission problem of high-frequency signals.

Description

technical field [0001] The invention belongs to the field of electromagnetic compatibility testing, and in particular relates to a potential distribution testing method of a wide-band large metal plate. Background technique [0002] When the electronic equipment on the metal structure platform is working, common ground impedance interference will be formed. When designing the overall equipment common ground impedance interference suppression, it is necessary to accurately grasp the ground potential distribution of the metal ground plate in order to effectively control the common ground impedance interference. . Although the simple metal plate ground potential distribution characteristics can be obtained through computer simulation, there is a lack of verification means for the simulation calculation results, and it is impossible to determine whether the data is accurate, so that the calculation results cannot be applied to actual engineering design. [0003] The existing te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/00
Inventor 宋文武黄琛张凯张炜刘义任平
Owner CHINA SHIP DEV & DESIGN CENT
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