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Automatic microscopic examination sampler

A sampler and microscopic inspection technology, applied in the field of automatic microscopic inspection sampler, can solve the problems of low detection efficiency, difficulty in adapting to large-scale, large-scale high-efficiency detection, and low accuracy, so as to improve inspection efficiency and improve detection work environment, fast effects

Inactive Publication Date: 2013-11-13
济南华天恒达科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] In the medical industry, such as leucorrhea, urine or feces analysis, conventional microscopic examination is basically performed manually, with low detection efficiency and low accuracy, it is difficult to adapt to large-scale, high-volume high-efficiency detection, and there are many inconveniences

Method used

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Embodiment Construction

[0018] The automatic mirror inspection sampler of the present invention will be described in detail below with reference to the accompanying drawings.

[0019] like figure 1 , the automatic mirror inspection sampler of the present invention, its structure includes a horizontal support 1 and a vertical support 2 that can move along the horizontal support.

[0020] like figure 1 and as Figure 5 , the horizontal support 1 is provided with a horizontal guide rail 3, a transverse driving device and a horizontal slider 5 that can move laterally on the horizontal guide rail 3 along the horizontal support 1, and one side of the horizontal slider 5 is provided with two threaded holes 6 and connected to the vertical support 2 by connecting bolts 61. There is a dovetail connection structure between the horizontal slider 5 and the horizontal guide rail 3 .

[0021] Described lateral driving device comprises: horizontal motor 11, first pulley 12, second pulley 13 and connect the first...

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Abstract

The invention discloses an automatic microscopic examination sampler and belongs to the field of medical detection. The automatic microscopic examination sampler is composed of a horizontal support and a vertical support capable of moving along the horizontal support. The horizontal support is provided with a horizontal guide rail, a transverse driving device and a horizontal sliding block capable of transversely moving along the horizontal guide rail. One side of the horizontal sliding block is provided with two threaded holes and the horizontal sliding block is connected to the vertical support through connecting bolts. The transverse driving device drives the vertical support and the horizontal sliding block to laterally move along the horizontal guide rail. The vertical support is provided with a vertical guide rail, a vertical driving device and a sampling probe base capable of sliding along the vertical support on the vertical guide rail. The sample feeding needle base is provided with sampling probe which can horizontally slide up and down along the vertical support under the effect of the vertical driving device. The automatic microscopic examination sampler provided by the invention can be used for substantially improving the accuracy and efficiency of the microscopic examination, is high in speed, can be used for perfecting the examination environment, greatly decreasing the labor intensity, and avoiding the inconvenience caused by traditional manual testing, and has the characteristics of time-saving and labor-saving properties, and simplicity in operation.

Description

technical field [0001] The invention relates to the field of medical detection and analysis devices, in particular to an automatic microscope inspection sampler. Background technique [0002] In the medical industry, such as leucorrhea, urine or feces analysis, conventional microscopic examination is basically performed manually, with low detection efficiency and low accuracy, and it is difficult to adapt to large-scale, high-volume high-efficiency detection, and there are many inconveniences. Contents of the invention [0003] The technical problem solved by the present invention is to overcome the deficiencies of the prior art and provide an automatic mirror inspection sampler with convenient operation, high operating precision, fast sampling speed and low cost. [0004] The technical scheme adopted by the present invention to solve the technical problem is: an automatic mirror inspection sampler, whose structure includes a horizontal support and a vertical support that ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/02G01N1/10
Inventor 郑小川
Owner 济南华天恒达科技有限公司
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