Memory built-in self-repair system and method based on Hash table

Abstract

The invention discloses a memory built-in self-repair (MBISR) system based on Hash table. The system comprises a built-in self-test (BIST) module and a built-in redundancy analysis (BIRA) module. The BIST module is used for carrying out tests on the memory, and temporarily stores tested fault addresses in the BIST module and outputs the fault addresses to the BIRA module; and the BIRA module is used for determining whether an access address is a fault address, and distributing redundancy resource to the fault address and carries out remapping on the fault address, thereby completing repair of the memory. The invention also discloses a memory built-in self-repair method based on Hash table. The invention has high address comparison efficiency, fundamentally solves the disadvantages of a traditional memory built-in self-repair method, such as low search address comparison efficiency and incapability to genuinely repair memory with multiple faults, and has the advantages of small land occupation and low power dissipation.

Description

technical field [0001] The invention relates to hash table storage and memory built-in self-repair (Memory Built-In Self-Repair, MBISR) technical field, in particular to a memory built-in self-repair system and method based on a hash table. Background technique [0002] With the continuous reduction of the size of the integrated circuit process, the density of the memory is increasing, and the number of memory failures is also increasing, which seriously affects the yield of the memory. In order to ensure the yield rate of memory, built-in self-repair technology of memory has emerged as the times require. With its flexible online repair characteristics, low cost and high repair rate and other advantages, it has gradually become an indispensable technical means to improve memory yield. [0003] The core idea of ​​the memory built-in self-repair technology is to replace the detected faulty storage unit with a preset redundant storage unit, so as to achieve the purpose of repai...

AI Technical Summary

Problems solved by technology

The address comparison efficiency of this full search type is low. When there are many faults, it takes a lot of clock cycles to judge whether the access address is a fault address, which makes the performance of the memory after repair deteriorate to an unacceptable level, and it is impossible to really repair the faults. more memory

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