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Semiconductor Packaging and Testing Fine-Day Feeding Control Method Based on Constrained Minimum Spanning Tree

A technology of packaging testing and control methods, applied in the field of control, can solve problems such as low equipment utilization, machine modification, and long production cycle, and achieve the effects of increasing production rate, shortening production cycle, and reducing the time cost of machine modification

Inactive Publication Date: 2015-10-28
无锡中科泛在信息技术研发中心有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the variety of different processing conditions is replaced, it is often accompanied by the replacement of processing materials or fixtures on the equipment. These replacements often lead to a certain amount of time and cost. The production workshop is called "machine modification" phenomenon.
Moreover, the cost of machine modification between different types of products is different, which leads to the problem of the production sequence of products. The existence of the phenomenon of "modification" leads to low equipment utilization rate and long production cycle of packaging and testing enterprises.

Method used

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  • Semiconductor Packaging and Testing Fine-Day Feeding Control Method Based on Constrained Minimum Spanning Tree
  • Semiconductor Packaging and Testing Fine-Day Feeding Control Method Based on Constrained Minimum Spanning Tree
  • Semiconductor Packaging and Testing Fine-Day Feeding Control Method Based on Constrained Minimum Spanning Tree

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Embodiment Construction

[0032] The present invention will be further described below with reference to the specific drawings and embodiments.

[0033] like figure 1 Shown: A constrained minimum spanning tree-based semiconductor packaging and testing fine-tuning control method, including the following steps:

[0034] Step 1: Obtain the type and quantity n of the products to be fed on a certain day from the current daily rough feeding control table, and initialize it as the set of all products to be processed in the daily fine feeding plan; and obtain from the current daily rough feeding control table. Production quantity C of each product i ;

[0035] Step 2: For the product set in Step 1, obtain the cost of changing the machine between the n products;

[0036] Step 3: For n products in the product set, n vertices of a graph are formed, and the cost of modification between any two products constitutes The weights of the edges; in this way, a completely undirected connected graph G=(V, E) is obtai...

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Abstract

Semiconductor encapsulation testing production belongs to a processing process with high flow process complexity and high fund density, relative to other manufacturing industries, the semiconductor encapsulation testing production is characterized in that the product types are various, the work procedure is complicated, and the utilization rate requirement on equipment is higher, so the fine feeding control plays an important role in improving the utilization rate of production system bottleneck equipment. By aiming at the bottleneck equipment, a problem to be solved is modeled as a problem for solving a constrained minimum spanning tree, and the constrained minimum spanning tree is obtained, so the specific feeding sequence and the specific feeding time of each product are obtained. The method solves the bottleneck problem caused by blind feeding, and finally, the effectiveness and the superiority of the method are verified through application research. The provided method has the advantages that the machine modification cost can be reduced, the production period is shortened, and the production benefit is improved.

Description

technical field [0001] The present invention relates to a control method, in particular to a method for controlling the fine-day feeding of semiconductor packaging and testing. Background technique [0002] Graph structure is a very important nonlinear data structure, and the minimum spanning tree with weighted graph is especially widely used in solving optimization problems in various fields such as engineering technology and scientific management. For example, Xue Chunyan clarified the optimization research of MST in urban expressway problems, Hu Hong mentioned the application of MST in communication networks, Liu Wei et al. explained MST in the optimization of mine ventilation design and reconstruction applications, etc. Graph theory is very interesting, strictly speaking, it is an important branch of combinatorics. Although graph theory is only the study of points and lines, its application field is very broad, not only limited to mathematics and computer science, but ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/418H01L21/67
CPCY02P90/02
Inventor 张国辉刘昶陈海赞姚丽丽史海波
Owner 无锡中科泛在信息技术研发中心有限公司
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