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3D measurement system

A technology of three-dimensional measurement and measurement platform, which is applied in the direction of measuring devices, instruments, and optical devices, and can solve the problems of mechanical offset, accuracy doubts, optical offset, etc. of the sliding mechanism

Active Publication Date: 2016-05-04
TEST RES INC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Similarly, there may be an optical offset in the optical grinding process of the beveled prism 144, and there may be a mechanical offset in the sliding mechanism, which also has double precision doubts in the above-mentioned known method.

Method used

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Embodiment Construction

[0063] A number of embodiments of the present invention will be disclosed below with the accompanying drawings. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some known and conventional structures and elements will be shown in a simple and schematic manner in the drawings.

[0064] see Figure 5A as well as Figure 5B , which shows a schematic diagram of a three-dimensional measurement system 300 according to an embodiment of the present invention. Such as Figure 5A As shown, the three-dimensional measurement system 300 includes a measurement carrier 320 , a projection module 340 , an imaging module 360 ​​and a control unit 380 .

[0065] The measurement carrie...

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Abstract

The invention discloses a three-dimensional measuring system. The three-dimensional measuring system comprises a measuring platform, a projection module, an image capturing module and a control unit. The measuring platform is used for bearing an object to measured. The projection module comprises a luminescence unit, a light shading rotation disc, a raster unit and a light reflection ring structure, wherein the luminescence unit is approximately disposed at the vertical axis of the measuring platform and is used for generating light; the light shading rotation disc is arranged between the luminescence unit and the object to be measured and is provided with a hole; the light passing through the hole sequentially forms a plurality of sections of light along with the rotation of the light shading rotation disc; the raster unit is used for converting the sections of the light passing through the hole into a plurality of striped light; and the light reflection ring structure is used for respectively reflecting the stripped light to the object to be measured.

Description

technical field [0001] The present invention relates to a three-dimensional measurement system, and in particular to an optical projection arrangement in a three-dimensional measurement system. Background technique [0002] In recent years, due to the reduction in the size of components, many automated high-precision testing equipment have been developed to detect whether the appearance, line connection, and alignment relationship of electronic components are proper. Among them, the automatic solder paste inspection machine (Solder Paste Inspection, SPI) uses three-dimensional measurement technology, and has been widely used to accurately measure the size of solder paste on the substrate on the production line, as a necessary tool for the control of the printed circuit board process. [0003] In the method of measuring the three-dimensional shape of the object to be measured, known common measurement methods such as the use of Moire pattern (MoirePattern) projection, using t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 余良彬林栋蔡知典
Owner TEST RES INC
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