Photoelectric detector parameter test fixture and test method
A photoelectric detector and parameter testing technology, which is applied in optical instrument testing, machine/structural component testing, instruments, etc., can solve the problems of lower test efficiency, complicated operation process, and long operation time, so as to improve test efficiency and simplify Operation steps, the effect of avoiding operation errors
Active Publication Date: 2015-12-02
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology
[0005] 1. There is no anti-error correction measure between the cable 5 and the 4 pins of the photodetector to be tested, which is prone to connection errors, and during the loading and unloading process, it is easy to cause the 4 pins of the photodetector to be tested to be deformed by force;
[0006] 2. It is necessary to use tools to install and replace the photodetector 4 to be tested, the operation process is complicated, the operation time is long, and the test efficiency is reduced;
[0007] 3. One test fixture can only be applied to one packaged photodetector, which has poor versatility
Method used
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[0034] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0035] like figure 2 As shown, the photodetector test fixture includes a fixed part 1 and a movable part 2. The movable part 2 is placed on the right side of the fixed part 1 of the test fixture, and can be disassembled by two manual screws 25a, which conforms to human operation habits.
[0036] The movable part 2 of the above-mentioned test fixture is a replaceable part, and a matching movable part can be selected according to different packaged photodetectors.
[0037] like image 3 As shown, the test fixture fixing part 1 includes a metal shielding box 11 and a printed board 12a, and the metal shielding box 11 includes a bottom box 13 and an upper cover 14 (such as figure 2 As shown), the upper cover 14 is installed on the upper part of the bottom box 13, which can form an airtight metal shielding ...
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The invention discloses a photoelectric detector parameter testing fixture and testing method. The photoelectric detector parameter testing fixture comprises a fixed portion and a movable portion, the fixed portion comprises a metal shielding box and a printed board mounted in the metal shielding box, a data interface is formed in the left side of the metal shielding box, and a connecting socket is arranged on the right side of the metal shielding box. The movable portion comprises a printed board, a cover board and a clamping device, the printed board is mounted at the back of the cover board, a connecting plug and a testing socket, the connecting plug is matched with the connecting socket, a positioning column and a manual screw are arranged on the cover board, and the clamping device is mounted on the left side of the cover board and provided with an optical input interface and a manual screw. The fixed portion is mounted on the left side of the movable portion in a connected manner by the aid of the manual screws. The movable portion of the fixture is a replaceable portion and can be replaced according to different photoelectric detectors, and universality of the fixture is improved. By the testing method, operation steps are simplified, testing efficiency is improved, and misoperation is effectively avoided.
Description
technical field [0001] The invention relates to the field of photodetector testing, in particular to a test fixture and a testing method for photodetector parameters. Background technique [0002] Photodetectors are the most basic receiving devices in optical communication systems, and their parameter performance directly determines the indicators of the entire optical communication system to a large extent. Therefore, it is often necessary to perform performance tests on various parameters of photodetectors. [0003] At present, special test fixtures are usually used to test the performance of photodetector parameters, figure 1 It is a structural schematic diagram of a test fixture of the prior art. The test fixture of the prior art includes: a metal shielding box 11, a printed board 13 and a clamping device 23, and the metal shielding box 11 includes a bottom box and an upper cover, and the metal shielding box 11 is used In order to prevent external noise from interfering...
Claims
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IPC IPC(8): G01M11/00
Inventor 吴仲孙桂清
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP