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The Design Method of Punching Alignment Target

A punching alignment target and design method technology, applied in electrical components, printed circuit manufacturing, printed circuits, etc., can solve problems affecting punching precision, accuracy, punching deviation, etc., to improve production efficiency, The effect of improving accuracy and avoiding size distortion

Inactive Publication Date: 2017-02-15
GUANGZHOU FASTPRINT CIRCUIT TECH +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] (1) Since the distance between the CCD lens is 1:1, the punching alignment target and the CCD lens are not in the same vertical position, which will have a certain impact on the accuracy of the CCD lens to capture the graphics, and then affect the punching accuracy
[0005] (2) The punching target pattern is not 1:1, and the multi-layer board punching machines used in the industry are all 1:1 punching, resulting in a certain offset of the punched hole relative to the pattern, because the punching machine sometimes Punching deviation will occur, it is difficult to judge whether the deviation is normal or there is a problem with the punching accuracy during manual inspection

Method used

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  • The Design Method of Punching Alignment Target
  • The Design Method of Punching Alignment Target
  • The Design Method of Punching Alignment Target

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0026] Embodiments of the present invention are described in detail below:

[0027] Such as figure 2 and 3 As shown, a method for designing a punching alignment target includes the following steps:

[0028] Designing the original line distribution graphics on the computer, the original line distribution graphics include punching alignment target graphics;

[0029] Maintain the proportion of the original graphic for the part of the punching alignment target graphic in the original line distribution graphic, and expand and contract the rest of the line layout graphic to obtain the expanded and contracted line distribution graphic;

[0030] Transfer the expansion and contraction line distribution graphics to the film to obtain the film graphics.

[0031] Further, the expansion and contraction has a corresponding expansion and contraction value, and the range of the expansion and contraction value is greater than 0.997 and less than 1 or greater than 1 and less than 1.003.

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PUM

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Abstract

The invention discloses a designing method of a punching alignment target. The designing method comprises the following steps that an original wire distribution graph is designed on a computer, wherein the original wire distribution graph comprises a punching alignment target graph; the original graph scale of the part of the punching alignment target graph in the original wire distribution graph is maintained, and expansion and contraction are conducted on the other parts in the wire distribution graph to obtain an expansion and contraction wire distribution graph. The expansion and contraction wire distribution graph is transferred onto a film, and a film graph is obtained accordingly. The designing method is beneficial for improving the punching precision.

Description

technical field [0001] The invention relates to a design method of a punching alignment target applied to a multilayer circuit board. Background technique [0002] With the development of electronic products towards miniaturization, multi-function and high integration, multi-layer boards have already become the mainstream of circuit boards. The number of layers of multi-layer boards is getting higher and higher, the wiring density is getting higher and higher, and the requirements for alignment accuracy between layers are getting higher and higher. The multi-layer board is formed by pressing multiple inner core boards. The inner core boards are designed with conductor patterns. The inner core boards are all punched first, and then aligned with the punched holes for binding or riveting, etc. , to ensure the alignment accuracy of the interlayer conductor pattern. Therefore, the accuracy of punching has a great influence on the final alignment accuracy between layers. The pu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H05K3/00
Inventor 杨烈文曾志军
Owner GUANGZHOU FASTPRINT CIRCUIT TECH
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