Real-time automatic depolarization detector for atomic beam fluorescence

Abstract

The invention provides a real-time automatic atomic beam fluorescence bias-reducing detector. A laser device, an atomic heating furnace, a vacuum device and a full reflector are fixedly connected to a mounting plate, wherein laser from the laser device and an atomic beam jetted by the atomic heating furnace are gathered in the vacuum device, and fluorescence generated by interaction of the laser and the atomic beam is shot from windows at two ends of the vacuum device; the fluorescence shot from the window at one end returns after running into the full reflector and is shot from the window at the other end, and is acquired through a fluorescence pre-acquisition device; a data acquisition card is used for acquiring data of the fluorescence pre-acquisition device and converting the data into a digital signal; the digital signal is transmitted to a computer for bias reducing treatment, and is displayed. The detector disclosed by the invention, which is free from a manual operation, realizes automatic signal bias reducing treatment on one hand, and reduces noise effect on the signal caused by design of a complex circuit on the other hand.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection, and in particular relates to a detector for atomic beam fluorescence signal collection and signal automatic depolarization processing. Background technique [0002] At present, the detection of atomic and molecular spectral lines in atomic physics experiments is mostly carried out in thermal atomic beams. There are more and more studies on the detection of spectral lines of alkaline earth metal thermal atoms with rich physical content. Transition, the fluorescent spectral line produced by mutual group transition is relatively weak. For the detection of this weak fluorescent spectral line, due to the influence of surrounding stray light, it will bring a large DC bias base to the weak fluorescent signal. Stray light The time and amplitude of the impact on the fluorescent signal are random, so the DC bias base loaded on the weak fluorescent signal is a random amount in time and size,...

AI Technical Summary

Problems solved by technology

Due to the randomness of interference sources such as external stray light, the DC bias base brought to the weak fluorescent signal is also random, and the manual de-biased fluorescent detector realized by circuit design will not have real-time operability and will not It can automatically remove the bias in real time, and through complex circuit design to realize the reduction of bias to process weak fluorescent signals, which will introduce noise from the circuit, such fluorescent signals are far from meeting the experimental needs

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