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Detection device for light emitting diode wafers

A technology of light-emitting diodes and detection devices, which is applied in the direction of testing optical properties, etc., can solve problems such as poor light collection efficiency of light sensing devices, and achieve the effects of solving poor light collection efficiency, accurate luminous efficiency, and detection luminous efficiency

Inactive Publication Date: 2014-04-16
GENESIS PHOTONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the above-mentioned problems in the prior art, one of the objectives of the present invention is to provide a light-emitting diode chip detection device to solve the problem of poor light collection efficiency of the light-sensing device

Method used

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  • Detection device for light emitting diode wafers
  • Detection device for light emitting diode wafers
  • Detection device for light emitting diode wafers

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Experimental program
Comparison scheme
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Embodiment Construction

[0046] see figure 1 , which is a schematic cross-sectional view of an embodiment of an inspection device for a light-emitting diode wafer of the present invention. Such as figure 1 As shown, the detection device of the LED chip of the present invention includes a transparent carrier 18 with a light-gathering function, a spot measuring device 100 and a light sensing device 15 . The transparent carrier 18 includes a light-incident surface 14 and a light-exit surface 16 , and the light-incident surface 14 is used to carry a plurality of LED chips 10 to be tested. The measuring device 100 includes two probes 12 and a power supply 13, and the two ends of the probes 12 are respectively electrically connected to one of a plurality of LED chips A and the power supply 13, and the power supply 13 is connected to the power supply 13 through the probes 12 The voltage source of the LED chip A is provided to make the LED chip A emit a plurality of light rays L1 , and the plurality of ligh...

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Abstract

A detection device for light emitting diode wafers comprises a transparent microscope stage with the light condensation function, a point detecting device and a light sensing device. The transparent microscope stage comprises an incident face and a light-emitting face, wherein the incident face is used for bearing a plurality of light emitting diode wafers to be detected. The point detecting device comprises two probes and a power supply unit, and the two ends of each probe are electrically connected with one of the light emitting diode wafers and the power supply unit respectively to enable the light emitting diode wafers to emit a plurality of light rays which irradiates the incident face of the transparent microscope stage. The light sensing device is arranged on one side of the light-emitting face of the transparent microscope stage and used for receiving the light rays passing through the transparent microscope stage.

Description

【Technical field】 [0001] The invention relates to a detection device, in particular to a detection device for a light-emitting diode wafer. 【Background technique】 [0002] With the advancement of science and technology and the improvement of quality of life, modern people pay more and more attention to lighting. From ancient times, torches, animal and vegetable oil lamps, candles, kerosene lamps, incandescent lamps, fluorescent lamps, or light-emitting diodes (LEDs), which are commonly used today, all show lighting. Play an extremely important role in human daily life. [0003] Light-emitting diodes emit monochromatic light through the combination of electron holes to achieve lighting or warning functions. Compared with traditional light sources, light-emitting diodes have the advantages of high luminous efficiency, long service life, not easy to break, and fast response speed. Due to the vigorous promotion of the government in recent years and the accelerated expansion o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 吴岱纬蔡泰成许国君许寿文李允立
Owner GENESIS PHOTONICS