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Measurement jig for radiation-induced electrical conductivity of dielectric materials under gamma irradiation

A technology of dielectric materials and measuring fixtures, applied in the field of measurement, can solve problems such as no measuring fixtures, and achieve the effect of improving accuracy

Inactive Publication Date: 2014-05-21
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] For the measurement of radiation-induced conductivity of dielectric materials under gamma irradiation, there is no suitable measurement fixture at present

Method used

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  • Measurement jig for radiation-induced electrical conductivity of dielectric materials under gamma irradiation

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Embodiment Construction

[0018] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not related to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the ar...

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Abstract

The invention provides a measurement jig for radiation-induced electrical conductivity of dielectric materials under gamma irradiation. The measurement jig comprises a top electrode bracket, a top electrode, a bottom electrode, a bottom electrode bracket and a base, wherein the top electrode and the bottom electrode are positioned between the top electrode bracket and the bottom electrode bracket, the top electrode is arranged below the top electrode bracket, the bottom electrode is arranged above the bottom electrode bracket, the space between the top electrode and the bottom electrode is used for holding the dielectric materials, and the top electrode bracket and the bottom electrode bracket are respectively fixedly connected with the base. By the aid of the measurement jig, accuracy of measuring the radiation-induced electrical conductivity of the dielectric materials under gamma irradiation can be improved.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a jig for measuring radiation-induced conductivity of dielectric materials under gamma irradiation. Background technique [0002] The electrification effect in the medium is one of the important reasons for the abnormal phenomenon of the spacecraft in orbit. More and more high-polymer dielectric materials are used in spacecraft, and the danger of internal electrification is greatly enhanced when the spacecraft operates in the harsh space radiation environment. In order to ensure the safety, reliability and long life of the spacecraft, a lot of energy has been invested internationally in the study of the charging mechanism and its effects in the medium, but domestic work in this area has just started. [0003] The degree of internal charging is related to factors such as the energy spectrum of the space environment, the dielectric properties / dimensions of the medium, the die...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R1/04
Inventor 王俊柳青李得天杨生胜秦晓刚陈益峰史亮汤道坦赵呈选
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH