A Gas Analyzer Sample Gas Chamber Device Convenient for Optical Path Adjustment

A technology of gas analyzer and optical path adjustment, which is applied in the direction of material analysis, measuring device, and material analysis through optical means, which can solve the problems of waste of labor, long time required, and increase of labor intensity of operators, so as to reduce labor intensity , to avoid the effect of multiple adjustments

Active Publication Date: 2017-05-03
BEIJING DEFINE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, the adjustment of the optical path of the sample gas chamber with multiple reflections is also relatively complicated, and the process of fixing and releasing the spherical reflector at the far end is required many times, which takes a long time, greatly wastes labor, and improves operation. labor intensity

Method used

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  • A Gas Analyzer Sample Gas Chamber Device Convenient for Optical Path Adjustment
  • A Gas Analyzer Sample Gas Chamber Device Convenient for Optical Path Adjustment

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Embodiment Construction

[0019] The core of the invention is to provide a gas analyzer sample gas chamber device which is convenient for optical path adjustment, so as to reduce the labor intensity of the operator.

[0020] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0021] Please refer to Figure 1-Figure 2 As shown, the present invention discloses a gas analyzer sample gas chamber device that facilitates optical path adjustment, including a sample gas chamber tube 2, a near-end spherical reflector 1 and a far-end spherical reflector 3 arranged inside the sample gas chamber tube 2 , the device also includes: an adjustment device 4 that is sealed with the inner wall of the sample gas chamber tube 2 and used to adjust the distance between the far-end spherical reflector 3 and the near-end spherical reflector 1, and t...

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Abstract

The present invention provides a gas analyzer sample gas chamber apparatus with a characteristic of easy optical path adjustment. The gas analyzer sample gas chamber apparatus comprises a sample gas chamber pipe, a proximal end spherical reflecting mirror and a distal end spherical reflecting mirror, wherein the proximal end spherical reflecting mirror and the distal end spherical reflecting mirror are arranged inside the sample gas chamber pipe. The gas analyzer sample gas chamber apparatus further comprises an adjustment device forming a sealed connection with the inner wall of the sample gas chamber pipe and provided for adjusting a distance between the proximal end spherical reflecting mirror and the distal end spherical reflecting mirror, wherein the distal end spherical reflecting mirror or the proximal end spherical reflecting mirror is connected with the adjustment device. According to the present invention, during detection, the adjustment device arranged on the inner wall of the sample gas chamber pipe can be adjusted, such that the distance between the proximal end spherical reflecting mirror and the distal end spherical reflecting mirror can be correspondingly changed so as to meet detection requirements; and the adjustment device is adjusted, such that the distance between the distal end spherical reflecting mirror arranged on the adjustment device and the proximal end spherical reflecting mirror is correspondingly changed so as to avoid multiple adjustment processes of the distal end spherical reflecting mirror and effectively reduce labor intensity of operators.

Description

technical field [0001] The invention relates to the technical field of gas analysis, in particular to a gas analyzer sample gas chamber device which is convenient for optical path adjustment. Background technique [0002] In coal mining, petrochemical, metallurgy and environmental protection industries, as people have higher and higher requirements for gas detection, people pay more and more attention to measurement technology and equipment. In recent years, optical measurement technology, especially tunable laser absorption spectroscopy technology, has developed rapidly and has been successfully applied in many industries. [0003] Since the content of the gas to be measured is usually relatively low, it is usually at the ppm (Part per million, a few parts per million) level. In order to ensure high measurement accuracy, at present, tunable laser absorption spectroscopy technology often uses multiple reflection sample gas chambers to increase the measurement optical path, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/39G01N21/01
Inventor 骆德全郁良韩敏艳周欣
Owner BEIJING DEFINE TECH
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