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Fourier transform infrared imaging spectrometer based on multistage micro-reflector

An infrared imaging spectrometer and Fourier transform technology, applied in the field of ground remote sensing detection, can solve the problems of uncompact structure and heavy weight, and achieve the effects of reducing the difficulty of installation and adjustment, improving real-time performance, and improving signal-to-noise ratio

Active Publication Date: 2014-07-09
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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AI Technical Summary

Benefits of technology

This innovative technology described in this patents uses a new type of device called Microscope Interference (MII) which combines two different types of devices - microlenses or step microscopes instead of moving reflectors for better image quality. By replacing these components, MI systems have higher sensitivity without adding any extra elements like screw threads. Additionally, they use special materials such as antireflectives coats to improve their durability against environmental factors such as rainwater. Overall, these technical improvements result in enhanced accuracy, efficiency, and functionality over conventional space modeled Fourier transformation cameras.

Problems solved by technology

This patented describes various technical problem addressed in this patents for improving imagers' ability to identify small targets at long distances due to their low signal strength compared to visible lights (LF). Current techniques such as scanning LIDAR) are limited because they require expensive equipment while also being bulky and heavier than desired.

Method used

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  • Fourier transform infrared imaging spectrometer based on multistage micro-reflector
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  • Fourier transform infrared imaging spectrometer based on multistage micro-reflector

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specific Embodiment approach 1

[0017] Specific implementation mode 1. Combination Figure 1 to Figure 5 In this embodiment, a Fourier transform infrared imaging spectrometer based on multi-level micro-mirrors is described. The imaging spectrometer is composed of a pre-imaging system 1 , an interference system 2 , a post-imaging beam shrinking system 3 and a focal plane detector 4 . Among them, the interference system 2 is composed of a multi-level stepped micro-mirror 7, a plane mirror 5, a sheet beam splitter 6 and a compensation plate 8; at a certain moment, the light emitted by the ground target object enters the imaging spectrometer system at a certain field of view , after passing through the pre-imaging system 1 and the sheet beam splitter 6, the images are respectively imaged on a stepped surface of the plane mirror 5 and the multi-step micro-mirror 7 . Wherein the different reflective surfaces of the multi-level stepped micro-mirror 7 correspond to images formed in a certain field of view range of g...

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Abstract

The invention discloses a Fourier transform infrared imaging spectrometer based on a multistage micro-reflector and relates to the field of earth remote sensing detection. The Fourier transform infrared imaging spectrometer solves the problem that a slit related to the spatial resolution is contained in an existing imaging spectrometer, and the luminous flux entering a system is limited. The Fourier transform infrared imaging spectrometer comprises a front imaging system, an interference system, a rear imaging system and a focal plane detector. The inference system comprises a multistage step micro-reflector piece-shaped beam splitter, a compensating plate and a plane reflector. After light emitted by a target passes through the front imaging system and the piece-shaped beam splitter, one beam is reflected to the plane reflector through the piece-shaped beam splitter to be imaged to be a first image point, and the other beam is transmitted through the piece-shaped beam splitter and then passes through the compensating plate to be imaged on a certain step reflecting face of the multistage step micro-reflector to be a second image point. Light of the first image point is transmitted through the piece-shaped beam splitter to reach the rear imaging system to be imaged, and light of the second image point passes through the compensating plate, is reflected by the piece-shaped beam splitter and is then imaged on a rear imaging beam contracting system, and an image of the rear imagining beam contracting system is received by the focal plane detector.

Description

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Claims

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Application Information

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Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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