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Optimization method for aging temperature and time of automotive electronic components

A technology of electronic components and aging temperature, applied in the direction of unstructured text data retrieval, etc., can solve the problems of reducing aging efficiency, too long time, affecting aging effect, etc.

Active Publication Date: 2019-09-13
SHANGHAI DAJUN TECH
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The time specified in the aging process may be too long or too short, and the temperature may be too high or too low, which will affect the aging effect, reduce the aging efficiency, and increase the aging cost

Method used

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  • Optimization method for aging temperature and time of automotive electronic components
  • Optimization method for aging temperature and time of automotive electronic components
  • Optimization method for aging temperature and time of automotive electronic components

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Embodiment Construction

[0029] The present invention is applicable to the optimization method of aging temperature and time of automobile electronic components and comprises the following steps:

[0030] Step 1. Set the aging temperature of the electronic components to 45°C, 55°C, and 65°C, and the aging time to 4 hours, 8 hours, 12 hours, 24 hours, 36 hours, 48 ​​hours, and 72 hours;

[0031] Step 2. Set the electronic component aging monitoring point, measure and record the representative key parameters of the electronic component after each aging time at each aging temperature;

[0032] Step 3. Use the PPK long-term process capability index to analyze and judge, according to the calculation formula of the PPK long-term process capability index:

[0033] (AVE(M)-LSL(Lower Tolerance)) / 3*Standard Deviation (1)

[0034] (USL(Upper Tolerance) - AVE(M)) / 3*Standard Deviation (2)

[0035] In formula (1) and formula (2): AVE (M) is the average value of all sample data corresponding to the measurement par...

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Abstract

The invention discloses an optimization method suitable for automobile electronic component aging temperature and time. In the method, multiple aging temperature and time are set firstly, and a representative key parameter of an electronic component is measured and recorded behind each aging time under each aging temperature respectively; and a PPK value under each aging temperature is calculated by utilizing a PPK long-term process capability index, the optimized temperature point is confirmed in a way of being not lower than level A, the optimized aging time is judged between a time point, at which an aging monitoring point of the electronic component enters into the stable state, and a larger time point of two adjacent time points with the minimum stable state variation, and finally the maximum time point in the optimized time of each monitoring point is selected to act as the final optimized aging time. Electronic component aging temperature and time are optimized by utilizing the PPK long-term process capability index, and the aging time as short as possible and the suitable aging temperature are confirmed under the premise of ensuring quality of the electronic component so that aging effect and efficiency are enhanced and aging cost is reduced.

Description

technical field [0001] The invention relates to an optimization method suitable for aging temperature and time of automobile electronic components. Background technique [0002] In order to achieve a satisfactory pass rate, almost all electronic components must be aged before they leave the factory. Under the condition of ensuring the reliability of electronic components, the aging efficiency can be improved, and the cost and time brought by the aging process can be reduced and shortened. It is the aging process of electronic components. problems faced. [0003] In the automotive electronics industry, there have been various debates on the aging of electronic components. Like other products, automotive electronic components / modules may fail at any time due to various reasons. Aging is to make defects appear in a short time by overloading electronic components to avoid failures in the early stages of use. Without aging, many electronic components will cause many problems du...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F16/30
Inventor 鲍建波苟文辉徐性怡
Owner SHANGHAI DAJUN TECH
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