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Reflection type adjustable ultrasonic probe

An ultrasonic and reflective technology, which is used in material analysis, measurement devices, and instruments using sonic/ultrasonic/infrasonic waves. It can solve the problems of lack of probes, unsatisfactory detection results, and large limitations in use, so as to increase the scope of application. Effect

Inactive Publication Date: 2014-07-30
CHANGZHOU CHANGCHAO ELECTRONICS RES INSTCO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Ultrasonic probes in the prior art generally have one model corresponding to one type of workpiece for detection, and the use limitations are relatively large, and for some unconventional workpieces, there is no best probe to match them, and the detection effect is not ideal

Method used

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  • Reflection type adjustable ultrasonic probe
  • Reflection type adjustable ultrasonic probe
  • Reflection type adjustable ultrasonic probe

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Embodiment Construction

[0017] The present invention is described in further detail now in conjunction with accompanying drawing. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.

[0018] Such as Figure 1-3 As shown, a reflective adjustable ultrasonic probe of the present invention includes a piezoelectric probe, a wedge 1 and a coupling agent 3, the upper end of the wedge 1 is provided with a square groove, and the bottom surface of the square groove is an arc surface, so The coupling agent 3 is arranged in the square groove, the end of the piezoelectric probe extends into the coupling agent 3, and the piezoelectric probe is connected to the wedge 1 in rotation. Protective film 4, piezoelectric chip 5, damping block 6, cable 7 and connector 8, described protective film 4 is arranged at the port of housing 2, and described piezoelectri...

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PUM

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Abstract

The invention relates to a reflection type adjustable ultrasonic probe, comprising a piezoelectric probe, a wedge block and a coupling agent, wherein a square groove is formed on the upper end face of the wedge block, the bottom surface of the square groove is a cambered surface, the coupling agent is placed in the square groove, the end part of the piezoelectric probe stretches into the coupling agent, the piezoelectric probe is rotationally connected with the wedge block, the piezoelectric probe comprises a shell, and a protective film, a piezoelectric wafer, a damping block, a cable and a joint, which are arranged in the shell in sequence, the protective film is arranged at the end opening of the shell, the piezoelectric wafer is correspondingly arranged above the protective film, the damping block is correspondingly arranged above the piezoelectric wafer, the joint is arranged in the middle of the top end of the shell, and the two ends of the cable are electrically connected with the piezoelectric wafer and the joint, respectively. The reflection type adjustable ultrasonic probe can be used for changing the incidence angle of ultrasonic wave by adjusting the inclination angle of the piezoelectric probe, so that the adaptation range of the probe is expanded.

Description

technical field [0001] The invention relates to the field of ultrasonic equipment, in particular to a reflective adjustable ultrasonic probe. Background technique [0002] At present, ultrasonic flaw detection is one of the most widely used non-destructive flaw detection methods. Ultrasonic flaw detection is divided into pulse type and diffraction type. The general pulse type flaw detection device mainly uses the reflection principle of ultrasonic waves in the workpiece to be tested. The chip resonates and enters the workpiece to emit refraction and reflection. According to the principle of reflection and refraction, before the ultrasonic wave enters the workpiece, a certain incident angle is required. [0003] Ultrasonic probes in the prior art generally have one model corresponding to one type of workpiece for detection, and the use limitations are relatively large. Moreover, for some unconventional workpieces, there is no best probe to match them, and the detection effect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/24
Inventor 周南岐
Owner CHANGZHOU CHANGCHAO ELECTRONICS RES INSTCO
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