The Method of Determining Measurement Uncertainty of S-Parameter of Vector Network Analyzer

A technology of vector network analysis and determination method, which is applied in the field of determination of uncertainty of S-parameter measurement of a vector network analyzer, and can solve the problems of not considering S-parameter correlation, imperfection, etc.

Active Publication Date: 2016-06-08
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, the above methods only give an empirical algorithm for the measurement uncertainty of S parameters, none of which considers the correlation of S parameters, and the above methods are not perfect

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • The Method of Determining Measurement Uncertainty of S-Parameter of Vector Network Analyzer
  • The Method of Determining Measurement Uncertainty of S-Parameter of Vector Network Analyzer
  • The Method of Determining Measurement Uncertainty of S-Parameter of Vector Network Analyzer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0065] like figure 1 As shown, it is a full two-port error model, where S 11A , S 21A , S 12A and S 22A is the true value of the S parameter of the tested part; S 11M , S 21M , S 12M and S 22M The measured value of the S parameter of the tested part when there is an error; E DF : Positive directional error; E DR : reverse directionality error; E SF : positive source matching error; E SR : reverse source matching error; E RF : forward reflection tracking error; E RR : back reflection tracking error; E XF : Forward isolation error; E XR : Reverse isolation error; E LF : positive load matching error; E LR : reverse load matching error; E TF : Forward transmission tracking error; E TR : Backward transmission tracking error.

[0066] like figure 2 As shown, it is a measurement uncertainty transmission structure diagram, which is the general idea of ​​the present invention. where [S X ] is the scattering parameter of the calibration piece, which includes two pa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for determining the uncertainty of the S parameter measurement conducted through a vector network analyzer, and relates to the technical field of calibration methods for the vector network analyzer. The method is achieved through MCM simulation, and therefore the problem that the relevance between S parameters needs to be considered when the uncertainty is evaluated through a GUM method and the problem that the uncertainty obtained through an experience algorithm is incomplete are solved. The method starts from the definition of a calibration piece, self-calibration is conducted on the vector network analyzer based on an SOLT calibration method, the uncertainty introduced through the calibration piece is transmitted to a measured piece through the vector network analyzer, and finally the measurement uncertainty of the S parameters of the measured piece measured by the vector network analyzer and the relevance between the S parameters are obtained through the MCM simulation method so that it can be ensured that performance of obtaining the accurate S parameters of the measured piece can be achieved for the vector network analyzer and measurement accuracy can be improved.

Description

technical field [0001] The invention relates to the technical field of calibration methods for vector network analyzers. Background technique [0002] Vector Network Analyzer (VectorNetworkAnalyzer, VNA) is the most widely used measurement instrument in the field of microwave measurement. In order to ensure the accuracy and reliability of the S parameter measurement value of the vector network analyzer, people have developed high-precision calibration parts for the self-calibration of the vector network analyzer, and the two-port vector network analyzer calibration technology is widely used in commercial instruments , the most important of which is the SOLT calibration technique based on the 12-term error model. [0003] Calibration technology generally includes three important parts: error model (ErrorModel), calibration process (CalibrationProcedure) and error correction (ErrorCorrection). Firstly, the source of the system error is determined according to the hardware st...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00
Inventor 韩志国梁法国栾鹏吴爱华李锁印孙晓颖冯亚南许晓青
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap