Method for determining uncertainty of S parameter measurement conducted through vector network analyzer

A technology for vector network analysis and parameter measurement, which is applied in the field of determining the uncertainty of S-parameter measurement of a vector network analyzer, and can solve problems such as imperfection and failure to consider S-parameter correlation.

Active Publication Date: 2014-08-13
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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Problems solved by technology

[0008] However, the above methods only give an empirical algorithm for the measurement uncertainty of S p

Method used

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  • Method for determining uncertainty of S parameter measurement conducted through vector network analyzer
  • Method for determining uncertainty of S parameter measurement conducted through vector network analyzer
  • Method for determining uncertainty of S parameter measurement conducted through vector network analyzer

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Embodiment Construction

[0065] Such as figure 1 Shown is a full two-port error model, where S 11A , S 21A , S 12A And S 22A Is the true value of the S parameter of the tested piece; S 11M , S 21M , S 12M And S 22M The measured value of the S parameter of the test piece when there is an error; E DF : Positive directional error; E DR : Reverse directional error; E SF : Forward source matching error; E SR : Reverse source matching error; E RF : Forward reflection tracking error; E RR : Back reflection tracking error; E XF : Positive isolation error; E XR : Reverse isolation error; E LF : Forward load matching error; E LR : Reverse load matching error; E TF : Forward transmission tracking error; E TR : Reverse transmission tracking error.

[0066] Such as figure 2 Shown is the measurement uncertainty transfer structure diagram, which is the general idea of ​​the present invention. Where [S X ] Is the scattering parameter of the calibrator, it includes two parts: [S Expected value ] And [U(S)], ...

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Abstract

The invention discloses a method for determining the uncertainty of the S parameter measurement conducted through a vector network analyzer, and relates to the technical field of calibration methods for the vector network analyzer. The method is achieved through MCM simulation, and therefore the problem that the relevance between S parameters needs to be considered when the uncertainty is evaluated through a GUM method and the problem that the uncertainty obtained through an experience algorithm is incomplete are solved. The method starts from the definition of a calibration piece, self-calibration is conducted on the vector network analyzer based on an SOLT calibration method, the uncertainty introduced through the calibration piece is transmitted to a measured piece through the vector network analyzer, and finally the measurement uncertainty of the S parameters of the measured piece measured by the vector network analyzer and the relevance between the S parameters are obtained through the MCM simulation method so that it can be ensured that performance of obtaining the accurate S parameters of the measured piece can be achieved for the vector network analyzer and measurement accuracy can be improved.

Description

Technical field [0001] The invention relates to the technical field of a calibration method of a vector network analyzer. Background technique [0002] Vector Network Analyzer (VNA) is the most widely used measuring instrument in the field of microwave measurement. In order to ensure the accuracy and reliability of the S-parameter measurement of the vector network analyzer, high-precision calibration parts have been developed for the self-calibration of the vector network analyzer. The two-port vector network analyzer calibration technology is widely used in commercial instruments , The most important of which is the SOLT calibration technology based on a 12-term error model. [0003] Calibration technology generally includes three important parts: Error Model, Calibration Procedure, and Error Correction. First, determine the source of the system error according to the hardware structure of the vector network analyzer, and then use the error model to visually express the relation...

Claims

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Application Information

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IPC IPC(8): G01R35/00
Inventor 韩志国梁法国栾鹏吴爱华李锁印孙晓颖冯亚南许晓青
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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